1 February 2008 Precision measurements for propagation properties of high-definition polymer waveguides by imaging of scattered light
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Abstract
We present a reliable, nondestructive, and real-time technique for characterization of propagation properties of planar optical waveguides based on accurately imaging the scattered light from the optical waveguide using a sensitive charge-coupled device (CCD) camera with built-in integration functionality. This technique can be used for real-time investigation of the propagation properties (loss, mode profile, bending properties, etc.) as well as the fabrication quality of planar optical waveguides. With this technique, we evaluate high-definition polymer optical waveguides on printed circuit board (PCB) substrates with a very low loss of 0.065 dB/cm at a wavelength of 850 nm, and measurement accuracy is less than 0.01 dB/cm. We expect this technique with the given CCD camera to be suitable for reliably measuring loss coefficients well below 0.1 dB/cm.
© (2008) Society of Photo-Optical Instrumentation Engineers (SPIE)
Fengtao Wang, Fengtao Wang, Fuhan Liu, Fuhan Liu, Gee-Kung Chang, Gee-Kung Chang, Ali Adibi, Ali Adibi, } "Precision measurements for propagation properties of high-definition polymer waveguides by imaging of scattered light," Optical Engineering 47(2), 024602 (1 February 2008). https://doi.org/10.1117/1.2842390 . Submission:
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