Translator Disclaimer
1 June 2008 Simultaneous phase-shifting ellipsometry based on grating beamsplitter
Author Affiliations +
Abstract
Simultaneous phase-shifting ellipsometry based on a grating beamsplitter is presented. In the corresponding setup, an orthogonal grating and analyzer array are used. The latter is composed of four separate analyzers arranged in a 2×2 grid, the polarization axes of which are set to 0, 45, 90, and 135 deg. A mask allows only four diffracted beams of the fist order, having the same optical intensities, to pass. Each beam is incident on one of the analyzers of the array. The intensities of the four beams are simultaneously detected by a quadrant detector. The ellipsometric parameters are obtained using the four intensity signals. The feasibility of simultaneous phase shifting ellipsometry is thus demonstrated.
©(2008) Society of Photo-Optical Instrumentation Engineers (SPIE)
Kun Yang, Aijun Zeng, Xiangzhao Wang, Feng Tang, and Hua Wang "Simultaneous phase-shifting ellipsometry based on grating beamsplitter," Optical Engineering 47(6), 063602 (1 June 2008). https://doi.org/10.1117/1.2948360
Published: 1 June 2008
JOURNAL ARTICLE
5 PAGES


SHARE
Advertisement
Advertisement
RELATED CONTENT

Modified transmission type four-detector polarimeter
Proceedings of SPIE (October 22 2004)
Laser Polarimetry: Review And Recent Developments
Proceedings of SPIE (January 25 1990)
High-Speed Ellipsometer For Thin-Film Deposition Monitoring
Proceedings of SPIE (February 27 1989)

Back to Top