1 June 2008 Line width measurement of semiconductor lasers using quantum interference in electromagnetically induced transparency: a quantum heterodyning method
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Optical Engineering, 47(6), 064201 (2008). doi:10.1117/1.2948312
Abstract
A technique is described in which electromagnetically induced transparency (EIT) spectra are used to measure laser line width. Two independent sets of EIT measurements are carried out in the presence of 85Rb and 87Rb atomic isotopes. Conventional self-heterodyning detection is used to obtain standard values of laser line width. A comparison shows that the estimated laser line widths in these measurements are very close to each other.
S. M. Iftiquar, "Line width measurement of semiconductor lasers using quantum interference in electromagnetically induced transparency: a quantum heterodyning method," Optical Engineering 47(6), 064201 (1 June 2008). http://dx.doi.org/10.1117/1.2948312
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KEYWORDS
Rubidium

Beam controllers

Laser beam diagnostics

Absorption

Semiconductor lasers

Heterodyning

Transparency

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