1 July 2008 Figures of merit and optimization of a VO2 microbolometer with strong electrothermal feedback
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Abstract
The influence of electrothermal feedback and hysteresis on the operation conditions, noise, and performance of a VO2 transition-edge microbolometer has been evaluated. The material undergoes a first-order semiconductor-to-metal phase transition (SMT) within the temperature range 402 film. For operation within the SMT, it extends well into the far IR wavelength region of the atmospheric window, but is substantially smaller for operation in the semiconducting region.
© (2008) Society of Photo-Optical Instrumentation Engineers (SPIE)
G. Neto, Luiz Alberto Luz de Almeida, Antonio Marcus Nogueira-Lima, C. S. Moreira, H. Neff, Igor A. Khrebtov, Valery G. Malyarov, "Figures of merit and optimization of a VO2 microbolometer with strong electrothermal feedback," Optical Engineering 47(7), 073603 (1 July 2008). https://doi.org/10.1117/1.2956386 . Submission:
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