PVr-a robust amplitude parameter for optical surface specification

Christopher J. Evans

doi:10.1117/1.3119307

1 April 2009 PVr-a robust amplitude parameter for optical surface specification

Christopher J. Evans

Author Affiliations +

Optical Engineering, Vol. 48, Issue 4, 043605 (April 2009). https://doi.org/10.1117/1.3119307

Abstract

Peak-to-valley departure (PV) is entrenched in optics design and manufacture as a characterization of an optical figure; modern interferometers commonly use 1k×1k detectors, the output of which may not be well represented by two points. PVr is a newly proposed robust amplitude parameter that combines the PV of a 36-term Zernike fit and the root mean square of the residual. This provides automatic filtering, is insensitive to system resolution, and relates directly to imaging performance via the Marechal criterion. Use of PVr in place of PV is recommended.

©(2009) Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation Download Citation

Christopher J. Evans "PVr-a robust amplitude parameter for optical surface specification," Optical Engineering 48(4), 043605 (1 April 2009). https://doi.org/10.1117/1.3119307

Published: 1 April 2009

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