New reconstruction method for x-ray testing of multilayer printed circuit board

Min Yang; Gao Wang; Yongzhan Liu

doi:10.1117/1.3430629

1 May 2010 New reconstruction method for x-ray testing of multilayer printed circuit board

Min Yang, Gao Wang, Yongzhan Liu

Author Affiliations +

Optical Engineering, Vol. 49, Issue 5, 056501 (May 2010). https://doi.org/10.1117/1.3430629

Abstract

For multilayer printed circuit board (PCB) and large-scale integrated circuit (LIC) chips, nondestructive testing of the inner structure and welding defects is very important for circuit diagram reverse design and manufacturing quality control. The traditional nondestructive testing of this kind of plate-like object is digital radiography (DR), which can provide only images with overlapped information, so it is difficult to get a full and accurate circuit image of every layer and the position of the defects using the DR method. At the same time, traditional computed tomography scanning methods are also unable to resolve this problem. A new reconstruction method is proposed for the nondestructive testing of plate-like objects. With this method, x rays irradiate the surface of the reconstructed object at an oblique angle, and a series of projection images are obtained while the object is rotating. Then, through a relevant preprocessing method on the projections and a special reconstructing algorithm, cross sections of the scanning region are finally obtained slice by slice. The experimental results prove that this method satisfactorily addresses the challenges of nondestructive testing of plate-like objects such as PCB or LIC.

©(2010) Society of Photo-Optical Instrumentation Engineers (SPIE)

Citation Download Citation

Min Yang, Gao Wang, and Yongzhan Liu "New reconstruction method for x-ray testing of multilayer printed circuit board," Optical Engineering 49(5), 056501 (1 May 2010). https://doi.org/10.1117/1.3430629

Published: 1 May 2010

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available