1 June 2010 Extension of the upper measuring limit in out-of plane deformation measurement by combination of digital holography and desensitized electronic speckle pattern interferometry
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Abstract
Digital holography and electronic speckle pattern interferometry are promising tools for industrial applications for deformation and shape measurements. Because of the limited measuring range, compensation methods can be applied in practical measurements. They can be digital, because these measuring techniques operate with images recorded with digital camera. We develop a new measurement setup, combining two out-of-plane displacement measurements with different sensitivities and an adaptive compensation method. Using this compensation method much more precise displacement maps can be produced than would be possible from a single measurement. One major task is to perform automatic measurements even if the deformation is higher than the upper measuring range of the basic method.
© (2010) Society of Photo-Optical Instrumentation Engineers (SPIE)
Richard Séfel, János Kornis, "Extension of the upper measuring limit in out-of plane deformation measurement by combination of digital holography and desensitized electronic speckle pattern interferometry," Optical Engineering 49(6), 065801 (1 June 2010). https://doi.org/10.1117/1.3456696 . Submission:
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