1 October 2011 Coupled plasmonic assisted progressive multiple resonance for dielectric material characterization
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Abstract
In this paper, we report the theoretical analysis of different types of plasmonic structures with the main emphasis on the coupled plasmon waveguide resonance due to several advantages offered by the same compared to other structures. Multiple resonance dips are found to increase with the increase in the dielectric layer thickness and this progressive nature of the dips can be efficiently utilized to characterize the dielectric material within a composite multilayer plasmonic structure. Supporting simulation results carried out in the MATLAB environment are also provided to validate the proposed application.
© (2011) Society of Photo-Optical Instrumentation Engineers (SPIE)
Mahua Bera, Mina Ray, "Coupled plasmonic assisted progressive multiple resonance for dielectric material characterization," Optical Engineering 50(10), 103801 (1 October 2011). https://doi.org/10.1117/1.3640823 . Submission:
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