1 November 2011 Toward high-sensitivity and high-resolution submillimeter-wave video imaging
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Abstract
Against a background of newly emerged security threats, the well-established idea of utilizing submillimeter-wave radiation for personal security screening applications has recently evolved into a promising technology. Possible application scenarios demand sensitive, fast, flexible and high-quality imaging techniques. At present, best results are obtained by passive imaging using cryogenic microbolometers as radiation detectors. Building upon the concept of a passive submillimeter-wave stand-off video camera introduced previously, we present the evolution of this concept into a practical application-ready imaging device. This has been achieved using a variety of measures such as optimizing the detector parameters, improving the scanning mechanism, increasing the sampling speed, and enhancing the image generation software. The camera concept is based on a Cassegrain-type mirror optics, an optomechanical scanner, an array of 20 superconducting transition-edge sensors operated at a temperature of 450 to 650 mK, and a closed-cycle cryogen-free cooling system. The main figures of the system include: a frequency band of 350±40 GHz, an object distance of 7 to 10 m, a circular field of view of 1.05 m diameter, and a spatial resolution in the image center of 2 cm at 8.5 m distance, a noise equivalent temperature difference of 0.1 to 0.4 K, and a maximum frame rate of 10 Hz.
© (2011) Society of Photo-Optical Instrumentation Engineers (SPIE)
Erik Heinz, Erik Heinz, Torsten May, Torsten May, Detlef Born, Detlef Born, Gabriel Zieger, Gabriel Zieger, Guenter Thorwirth, Guenter Thorwirth, Solveig Anders, Solveig Anders, Viatcheslav Zakosarenko, Viatcheslav Zakosarenko, Torsten Krause, Torsten Krause, André Krüger, André Krüger, Marco Schulz, Marco Schulz, Hans-Georg Meyer, Hans-Georg Meyer, Marco Schubert, Marco Schubert, Michael Starkloff, Michael Starkloff, } "Toward high-sensitivity and high-resolution submillimeter-wave video imaging," Optical Engineering 50(11), 113204 (1 November 2011). https://doi.org/10.1117/1.3654089 . Submission:
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