1 March 2011 Measurement of the third-order optical nonlinear properties of a metal/porous silicon composite system
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Abstract
We report the measurements of the nonlinear refractive index of a metal/porous silicon composite system as measured by the reflection Z-scan technique. The composite system is formed by using magnetron sputtering to deposit thin metallic films onto porous silicon anodized on p-type silicon. The experiment results indicate an enhancement over the nonlinear refractive index of the composite system, which suggests an opportunity to form new-type nonlinear-optical media consisting of porous silicon for nonlinear optical applications such as power limiting or optical switching.
© (2011) Society of Photo-Optical Instrumentation Engineers (SPIE)
Mei Xiang, Mei Xiang, Zhenhong Jia, Zhenhong Jia, Xiaoyi Lv, Xiaoyi Lv, Furu Zhong, Furu Zhong, } "Measurement of the third-order optical nonlinear properties of a metal/porous silicon composite system," Optical Engineering 50(3), 033604 (1 March 2011). https://doi.org/10.1117/1.3554382 . Submission:
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