1 July 2011 Wavelet-based moment invariants for pattern recognition
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Abstract
Moment invariants have received a lot of attention as features for identification and inspection of two-dimensional shapes. In this paper, two sets of novel moments are proposed by using the auto-correlation of wavelet functions and the dual-tree complex wavelet functions. It is well known that the wavelet transform lacks the property of shift invariance. A little shift in the input signal will cause very different output wavelet coefficients. The autocorrelation of wavelet functions and the dual-tree complex wavelet functions, on the other hand, are shift-invariant, which is very important in pattern recognition. Rotation invariance is the major concern in this paper, while translation invariance and scale invariance can be achieved by standard normalization techniques. The Gaussian white noise is added to the noise-free images and the noise levels vary with different signal-to-noise ratios. Experimental results conducted in this paper show that the proposed wavelet-based moments outperform Zernike's moments and the Fourier-wavelet descriptor for pattern recognition under different rotation angles and different noise levels. It can be seen that the proposed wavelet-based moments can do an excellent job even when the noise levels are very high.
© (2011) Society of Photo-Optical Instrumentation Engineers (SPIE)
Guangyi Chen, Wenfang Xie, "Wavelet-based moment invariants for pattern recognition," Optical Engineering 50(7), 077205 (1 July 2011). https://doi.org/10.1117/1.3597329 . Submission:
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