1 September 2011 Precision measurement system using binary phase computer-generated holograms
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Abstract
We present a novel method of obtaining precision measurement using two binary phase diffractive optical elements, termed the hologram, and phase mask. By encoding multiple views into the hologram, each of which corresponds to a horizontal or vertical relative displacement of the phase mask, the system is able to provide a visual feedback of the measurement without the use of electronics. A probabilistic method for detection of the resultant images, matched to the statistical properties of holographic replay, shows promise for enabling a fully automated measurement system.
© (2011) Society of Photo-Optical Instrumentation Engineers (SPIE)
Edward Buckley, Adrian J. Cable, Timothy D. Wilkinson, "Precision measurement system using binary phase computer-generated holograms," Optical Engineering 50(9), 091308 (1 September 2011). https://doi.org/10.1117/1.3596201 . Submission:
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