Snapshot advantage: a review of the light collection improvement for parallel high-dimensional measurement systems

Nathan A. Hagen; Liang S. Gao; Tomasz S. Tkaczyk; Robert T. Kester

doi:10.1117/1.OE.51.11.111702

13 June 2012 Snapshot advantage: a review of the light collection improvement for parallel high-dimensional measurement systems

Nathan A. Hagen, Liang S. Gao, Tomasz S. Tkaczyk, Robert T. Kester

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Optical Engineering, Vol. 51, Issue 11, 111702 (June 2012). https://doi.org/10.1117/1.OE.51.11.111702

Abstract

The snapshot advantage is a large increase in light collection efficiency available to high-dimensional measurement systems that avoid filtering and scanning. After discussing this advantage in the context of imaging spectrometry, where the greatest effort towards developing snapshot systems has been made, we describe the types of measurements where it is applicable. We then generalize it to the larger context of high-dimensional measurements, where the advantage increases geometrically with measurement dimensionality.

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Nathan A. Hagen, Liang S. Gao, Tomasz S. Tkaczyk, and Robert T. Kester "Snapshot advantage: a review of the light collection improvement for parallel high-dimensional measurement systems," Optical Engineering 51(11), 111702 (13 June 2012). https://doi.org/10.1117/1.OE.51.11.111702

Published: 13 June 2012

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