2 November 2012 Fourier transform profilometry using a binary area modulation technique
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Abstract
A recent study found that it is very difficult to use the squared binary defocusing technique to eliminate the influence of third-order harmonics without compromising fringe quality, and thus it is challenging to utilize Fourier transform profilometry to achieve high-quality three-dimensional measurement. A novel approach is presented to effectively eliminate the third-order harmonics by modulating the squared binary structured patterns. Both simulation and experiments are presented to verify the performance of the proposed technique.
© 2012 Society of Photo-Optical Instrumentation Engineers (SPIE)
William Lohry, William Lohry, Song Zhang, Song Zhang, } "Fourier transform profilometry using a binary area modulation technique," Optical Engineering 51(11), 113602 (2 November 2012). https://doi.org/10.1117/1.OE.51.11.113602 . Submission:
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