4 May 2012 Accuracy of the reflectance spectrum recovery in a light-emitting diode-based multispectral imaging system
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Abstract
We present a study of parameters that affect the accuracy of a reflectance spectrum recovery from the compressed data obtained in a multispectral imaging (MSI) system consisting of a computer-controlled set of light-emitting diodes (LEDs) synchronously switched with a digital monochrome camera. The system allows recovery of a two-dimensional distribution of reflection spectra in a wide spectral range (400 to 700 nm) just from a few captured frames. It is shown that the MSI system designed and assembled by students in a University laboratory is capable of measuring of absolute values of smooth reflectance spectra with an error smaller than 3%. Further, the increasing of the system accuracy could be achieved by providing higher spatial uniformity and higher overlapping of object illumination by all the LEDs.
© 2012 Society of Photo-Optical Instrumentation Engineers (SPIE)
Laure Fauch, Ervin Nippolainen, Alexei A. Kamshilin, "Accuracy of the reflectance spectrum recovery in a light-emitting diode-based multispectral imaging system," Optical Engineering 51(5), 053201 (4 May 2012). https://doi.org/10.1117/1.OE.51.5.053201 . Submission:
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