Combining shearography and interferometric fringe projection in a single device for complete control of industrial applications

Pascal Blain; Fabrice R. Michel; Pierre Piron; Yvon L. Renotte; Serge Habraken

doi:10.1117/1.OE.52.8.084102

9 August 2013 Combining shearography and interferometric fringe projection in a single device for complete control of industrial applications

Pascal Blain, Fabrice R. Michel, Pierre Piron, Yvon L. Renotte, Serge Habraken

Author Affiliations +

Optical Engineering, Vol. 52, Issue 8, 084102 (August 2013). https://doi.org/10.1117/1.OE.52.8.084102

Abstract

Noncontact optical measurement methods are essential tools in many industrial and research domains. A family of new noncontact optical measurement methods based on the polarization states splitting technique and monochromatic light projection as a way to overcome ambient lighting for in-situ measurement has been developed. Recent works on a birefringent element, a Savart plate, allow one to build a more flexible and robust interferometer. This interferometer is a multipurpose metrological device. On one hand the interferometer can be set in front of a charge-coupled device (CCD) camera. This optical measurement system is called a shearography interferometer and allows one to measure microdisplacements between two states of the studied object under coherent lighting. On the other hand, by producing and shifting multiple sinusoidal Young’s interference patterns with this interferometer, and using a CCD camera, it is possible to build a three-dimensional structured light profilometer.

Citation Download Citation

Pascal Blain, Fabrice R. Michel, Pierre Piron, Yvon L. Renotte, and Serge Habraken "Combining shearography and interferometric fringe projection in a single device for complete control of industrial applications," Optical Engineering 52(8), 084102 (9 August 2013). https://doi.org/10.1117/1.OE.52.8.084102

Published: 9 August 2013

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