23 October 2013 Confocal multiple-transmitted-light interference microscope with increased lateral resolution
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Optical Engineering, 52(10), 100504 (2013). doi:10.1117/1.OE.52.10.100504
Abstract
A plane-parallel plate of a specific thickness placed in front of the collecting lens in a confocal microscope (CM) is used to produce multiple-transmitted-light interference to sharpen the Airy main lobe so that the lateral resolution in the x -direction can be further improved. Numerical experiments show that the lateral full-width at half maximum in the x -direction has been narrowed down to 50 nm, and the lateral resolution has been improved by 80% in comparison with a conventional CM when thickness d =5  mm , reflectivity R=0.7 , and NA=0.65 .
© 2013 Society of Photo-Optical Instrumentation Engineers (SPIE)
Lirong Qiu, Weiqian Zhao, "Confocal multiple-transmitted-light interference microscope with increased lateral resolution," Optical Engineering 52(10), 100504 (23 October 2013). http://dx.doi.org/10.1117/1.OE.52.10.100504
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KEYWORDS
Confocal microscopy

Curium

Microscopes

Point spread functions

Objectives

Near field optics

Reflectivity

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