16 July 2013 One-dimensional gradient-index metrology based on ray slope measurements using a bootstrap algorithm
Author Affiliations +
Abstract
The refractive index profile of one-dimensional gradient-index (GRIN) samples can be measured using the incident and exit beam angles of multiple beams passing through the sample at different positions along the index gradient. Beginning from a region of known refractive index, the collective angular deflection measurement of multiple beams is bootstrapped to compute the index profile of the entire sample. An alternative method using an approximate beam displacement model and a corrective algorithm is also presented. The two techniques are used to measure the index profile of a thick GRIN sample, and experimental results show good agreement with a maximum discrepancy of 1.5×10 [sup]−3 in the calculated index. An index accuracy of 5×10 −4 is predicted for the bootstrap method employing typical micron-level spatial measurements.
© 2013 Society of Photo-Optical Instrumentation Engineers (SPIE)
Di Lin, Di Lin, James R. Leger, James R. Leger, Mint Kunkel, Mint Kunkel, Peter McCarthy, Peter McCarthy, } "One-dimensional gradient-index metrology based on ray slope measurements using a bootstrap algorithm," Optical Engineering 52(11), 112108 (16 July 2013). https://doi.org/10.1117/1.OE.52.11.112108 . Submission:
JOURNAL ARTICLE
11 PAGES


SHARE
Back to Top