1 February 2013 Reconstruction of optical images of graphene-based materials coated on dielectric substrates
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Optical Engineering, 52(2), 023601 (2013). doi:10.1117/1.OE.52.2.023601
Abstract
The colors of thin and thick layers of graphene and graphene oxide films on either SiO 2 or Si 3 N 4 grown silicon substrates were generated by a theoretical calculation procedure. The effects of the thicknesses of the material and the dielectric layers on the visibility of the graphene-based materials were investigated. The theoretical investigation was supplemented by measurements of the thicknesses of the material layers using either an atomic force microscope or a profilometer, depending on the thickness range. By combining the color calculation procedure with the measured thickness profiles, optical images of graphene-based materials on dielectric substrates can be reconstructed. The reconstructed image corresponds well to the real microscope image, which suggests that the image reconstruction procedure is a convenient way to investigate colors and determine the thickness of graphene-based materials.
© 2013 Society of Photo-Optical Instrumentation Engineers (SPIE)
Inhwa Jung, Yong Joo Ra, Jong Yeog Son, Yong Tae Kang, Kyong-Yop Rhee, "Reconstruction of optical images of graphene-based materials coated on dielectric substrates," Optical Engineering 52(2), 023601 (1 February 2013). http://dx.doi.org/10.1117/1.OE.52.2.023601
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KEYWORDS
Graphene

Silicon

Oxides

RGB color model

Dielectrics

Visibility

Multilayers

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