Review of snapshot spectral imaging technologies

Nathan A. Hagen; Michael W. Kudenov

doi:10.1117/1.OE.52.9.090901

23 September 2013 Review of snapshot spectral imaging technologies

Nathan A. Hagen, Michael W. Kudenov

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Optical Engineering, Vol. 52, Issue 9, 090901 (September 2013). https://doi.org/10.1117/1.OE.52.9.090901

Abstract

Within the field of spectral imaging, the vast majority of instruments used are scanning devices. Recently, several snapshot spectral imaging systems have become commercially available, providing new functionality for users and opening up the field to a wide array of new applications. A comprehensive survey of the available snapshot technologies is provided, and an attempt has been made to show how the new capabilities of snapshot approaches can be fully utilized.

CC BY: © The Authors. Published by SPIE under a Creative Commons Attribution 4.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.

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Nathan A. Hagen and Michael W. Kudenov "Review of snapshot spectral imaging technologies," Optical Engineering 52(9), 090901 (23 September 2013). https://doi.org/10.1117/1.OE.52.9.090901

Published: 23 September 2013

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