21 January 2014 Short wavelength and polarized phase shifting fringe projection imaging of translucent objects
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Abstract
Measuring surface topography of translucent objects with phase shifting fringe projection method is a challenge because of the reduced fringe contrast due to the scattering inside the object. The internal structure also has an impact to the measurement. We present a new phase shifting fringe project imaging method to measure three-dimensional surface shapes of translucent objects. This method employs polarized short wavelength to increase the fringe contrast by reducing the internal scattered light from reaching the camera.
© 2014 Society of Photo-Optical Instrumentation Engineers (SPIE)
Rongguang Liang, Rongguang Liang, } "Short wavelength and polarized phase shifting fringe projection imaging of translucent objects," Optical Engineering 53(1), 014104 (21 January 2014). https://doi.org/10.1117/1.OE.53.1.014104 . Submission:
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