29 April 2014 Statistical patterns: an approach for high-speed and high-accuracy shape measurements
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Abstract
Statistical patterns have been used for structured illumination within a stereo-photogrammetry setup to precisely measure the shape of nearly arbitrary objects in a short time. This contribution gives an overview of recently developed projection setups based on such statistical patterns. Coherent and incoherent approaches as well as the applied reconstruction algorithm are explained. The results show the suitability of the statistical pattern projection approach to replace the commonly used slow digital light processing (DLP) projectors of three-dimensional shape sensors and facilitate measurements in an ultrashort time frame (microsecond range), e.g., to track moving objects.
© 2014 Society of Photo-Optical Instrumentation Engineers (SPIE)
Martin Schaffer, Martin Schaffer, Marcus Große, Marcus Große, Bastian Harendt, Bastian Harendt, Richard Kowarschik, Richard Kowarschik, } "Statistical patterns: an approach for high-speed and high-accuracy shape measurements," Optical Engineering 53(11), 112205 (29 April 2014). https://doi.org/10.1117/1.OE.53.11.112205 . Submission:
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