12 November 2014 Measurement of dynamic interferometer baseline perturbations by means of wavelength-scanning interferometry
Author Affiliations +
Optical Engineering, 53(11), 114103 (2014). doi:10.1117/1.OE.53.11.114103
An approach for measuring fast oscillations of an absolute value of interferometer optical path difference (OPD) has been developed. The principles of frequency-scanning interferometry are utilized for the registration of the interferometer spectral function from which the OPD is calculated. The proposed approach enables one to capture the absolute baseline variations at frequencies much higher than the spectral acquisition rate. Despite the conventional approaches associating a single baseline indication to the registered spectrum, in the proposed method, a specially developed demodulation procedure is applied to the spectrum. This provides the ability to capture the baseline variations that took place during the spectrum acquisition. An analytical model describing the limitations on the parameters of the possibly registered baseline variations is developed. The experimental verification of the proposed approach and the developed model has been performed.
© 2014 Society of Photo-Optical Instrumentation Engineers (SPIE)
Nikolai Ushakov, Leonid Liokumovich, "Measurement of dynamic interferometer baseline perturbations by means of wavelength-scanning interferometry," Optical Engineering 53(11), 114103 (12 November 2014). https://doi.org/10.1117/1.OE.53.11.114103

Back to Top