13 November 2014 Application of the transmission line method for the study of highly nonlinear multilayer optical structures
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Abstract
In this work, we numerically investigate and analyze the properties of an optical structure composed of successive thin film layers that can possess high values of nonlinear susceptibility, affecting the refractive index and/or the absorption coefficient. By applying the transmission line method properly modified to resolve the inclusion of third-order nonlinearity, the spectral reflectivity and transmission of such a device are presented. Specifically, the method is applied to a conceptual design of a distributed Bragg reflector. Optical bistability can be observed, which translates not only to a change in the value of reflectivity as the input power increases, but also to a shift of the Bragg wavelength.
© 2014 Society of Photo-Optical Instrumentation Engineers (SPIE)
Nikolaos Moshonas, Nikolaos Moshonas, Gerasimos K. Pagiatakis, Gerasimos K. Pagiatakis, Panagiotis Papagiannis, Panagiotis Papagiannis, Stylianos P. Savaidis, Stylianos P. Savaidis, Nikolaos A. Stathopoulos, Nikolaos A. Stathopoulos, } "Application of the transmission line method for the study of highly nonlinear multilayer optical structures," Optical Engineering 53(11), 115106 (13 November 2014). https://doi.org/10.1117/1.OE.53.11.115106 . Submission:
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