14 July 2014 Carrier-envelope offset frequency noise analysis in Ti:sapphire frequency combs
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Abstract
We experimentally study two Ti:sapphire optical frequency comb femtosecond regimes, respectively, with a linear and a nonlinear dependence of the carrier-envelope offset frequency (fCEO) on pump intensity. For both regimes, we study the effect of single- and multimode pump lasers on the fCEO phase noise. We demonstrate that the femtosecond regime is playing a more important role on the fCEO phase noise and stability than the pump laser type.
© 2014 Society of Photo-Optical Instrumentation Engineers (SPIE)
Denis V. Sutyrin, Nicola Poli, Nicolò Beverini, Guglielmo M. Tino, "Carrier-envelope offset frequency noise analysis in Ti:sapphire frequency combs," Optical Engineering 53(12), 122603 (14 July 2014). https://doi.org/10.1117/1.OE.53.12.122603
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