Open Access
14 July 2014 In situ fringe projector development for thermal coating deposition
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Abstract
Thermal barrier coatings (TBCs) and plasma spray coatings, in general, require fine control over the deposited thickness to achieve a reliable coating performance. Currently, the plasma spray industry quantifies thickness by sampling the part before and after TBC deposition. Approximate thickness is inferred from previous runs; however, process variability can cause errors in these approximations that result in wasted time and resources that can ultimately lead to nonreliant coatings. To this end, we present an in situ optical fringe projector technology that enables coating thickness measurements across a two-dimensional surface. The sensor is capable of achieving micron scale resolution in the harsh environment of a thermal spray booth. Furthermore, unlike the existing approaches, this technique is extendable to parts with complex geometries. The underlying background of the fringe projection method, including a differential measurement technique, is presented. Current results on production equipment and cylindrical parts are also discussed, showing good correlation and agreement with physical measurements captured in an industrial setting.
CC BY: © The Authors. Published by SPIE under a Creative Commons Attribution 4.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.
Nicholas D. Trail, Michael W. Kudenov, and Eustace L. Dereniak "In situ fringe projector development for thermal coating deposition," Optical Engineering 53(7), 074105 (14 July 2014). https://doi.org/10.1117/1.OE.53.7.074105
Published: 14 July 2014
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Coating

Projection systems

Plasma

Sensors

In situ metrology

Phase measurement

Optical engineering

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