Open Access
16 April 2014 Improved iterative algorithm for the three-flat test
Bo Gao, Qiang Li, Yuhang He, Liqun Chai
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Abstract
An iterative algorithm has been successfully used to process data from the three-flat test. On the basis of the iterative algorithm proposed by Vannoni, which is much faster and more effective than the Zernike polynomial fitting method, an improved algorithm is presented. By optimizing the iterative steps and removing the scaling factors, the surface shape can be easily computed in a few iterations. The validity of the method is proved by computer simulation, and the interpolation error and principle error are analyzed.
CC BY: © The Authors. Published by SPIE under a Creative Commons Attribution 4.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.
Bo Gao, Qiang Li, Yuhang He, and Liqun Chai "Improved iterative algorithm for the three-flat test," Optical Engineering 53(9), 092004 (16 April 2014). https://doi.org/10.1117/1.OE.53.9.092004
Published: 16 April 2014
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CITATIONS
Cited by 5 scholarly publications.
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KEYWORDS
Error analysis

Data processing

Computer simulations

Optical engineering

Reconstruction algorithms

Zernike polynomials

Lithium

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