15 August 2014 Far-field spatially angle-resolved scattering measurements: practical way to recover surface topography
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Abstract
Angle-resolved scattering techniques are currently used to extract the second-order statistical moments (roughness spectra or autocorrelation function) of surface topography, but have not allowed the recovery of the surface topography itself. We show how we could solve this point with an original setup based on spatially resolved measurements. Hence, the technique provides a breakthrough in light-scattering characterization.
© 2014 Society of Photo-Optical Instrumentation Engineers (SPIE)
Myriam Zerrad, Myriam Zerrad, Michel Lequime, Michel Lequime, Claude Amra, Claude Amra, } "Far-field spatially angle-resolved scattering measurements: practical way to recover surface topography," Optical Engineering 53(9), 092012 (15 August 2014). https://doi.org/10.1117/1.OE.53.9.092012 . Submission:
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