10 September 2015 Alternative phase-shifting technique for measuring full-field refractive index
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Optical Engineering, 54(9), 094101 (2015). doi:10.1117/1.OE.54.9.094101
Abstract
This study proposes an alternative and simple method for measuring full-field refractive index. This method is based on the phase-shifting technique with a modulated electro-optical (EO) modulator and the phenomenon of total internal reflection. To this purpose, a linear polarized light is expanded and incident on the interface between the prism and the tested specimen, and the reflected light passes through an analyzer for interference. The phase difference between the s- and p-polarized light is sensitive to the refractive index of the tested specimen when the total internal reflection appears on this interface. Based on this effect, the resulting phase differences make it possible to analyze the refractive index of the tested specimen through a phase-shifting technique with a modulated EO modulator. The feasibility of this method was verified by experiment, and the measurement resolution can reach a value of refractive index unit of at least 3.552×10−4. This method has advantages of simple installation, ease of operation, and fast measurement.
Chen, Chen, Lin, and Chu: Alternative phase-shifting technique for measuring full-field refractive index
Kun-Huang Chen, Jing-Heng Chen, Jiun-You Lin, Yen-Chang Chu, "Alternative phase-shifting technique for measuring full-field refractive index," Optical Engineering 54(9), 094101 (10 September 2015). http://dx.doi.org/10.1117/1.OE.54.9.094101
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KEYWORDS
Refractive index

Phase shifts

Modulators

Modulation

Prisms

CMOS cameras

Interferometry

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