26 March 2015 Study of oblique incidence characterization of parallel aligned liquid crystal on silicon
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Abstract
The phase-only liquid crystal on silicon (LCOS) spatial light modulator has been used as a wavefront generator and reconstruction device for display applications due to its phase-only modulating property of incident light. In order to achieve the best reconstructed phase modulated wavefront, the properties of LCOS have to be fully known. The intensity of reflected light from LCOS decreases under normal incidence by going through a beam splitter. In order to improve the intensity of the reflected light beam, the oblique incidence is preferred during many applications. The oblique incidence characterization of a parallel aligned LCOS is investigated at a working wavelength of 532 nm on the basis of double-hole interferometric method. Through experiments, the phase modulation characterization of LCOS under the oblique incidence is obtained. In addition, an image postprocessing method is proposed to overcome the effect of flicker and coherent noise by simplifying the computation and increasing the measurement accuracy. The comparison of experimental results for different incident angles indicates that it plays an important role in the performance of phase modulation of LCOS, where the phase modulation decreases with the increasing angle of incidence.
© 2015 Society of Photo-Optical Instrumentation Engineers (SPIE)
Spozmai Panezai, Dayong Wang, Jie Zhao, Yunxin Wang, Lu Rong, Sijin Ma, "Study of oblique incidence characterization of parallel aligned liquid crystal on silicon," Optical Engineering 54(3), 037109 (26 March 2015). https://doi.org/10.1117/1.OE.54.3.037109 . Submission:
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