21 October 2016 Radio frequency switching network: a technique for infrared sensing
Author Affiliations +
This paper describes a unique technique that implements photoconductive sensors in a radio frequency (RF) switching network designed to locate in real-time the position and intensity of IR radiation incident on a composite structure. In the implementation described here, photoconductive sensors act as rapid response switches in a two-layer RF network embedded in an FR-4 laminate. To detect radiation, phosphorous-doped silicon photoconductive sensors are inserted in GHz range RF transmission lines. By permitting signal propagation only when a sensor is illuminated, the RF signals are selectively routed from lower layer transmission lines to upper layer lines, thereby pinpointing the location and strength of incident radiation. Simulations based on a high frequency three-dimensional planar electromagnetics model are presented and compared to the experimental results. The experimental results are described for GHz range RF signal control for 300- and 180-mW incident energy from 975- to 1060-nm wavelength lasers, respectively, where upon illumination, RF transmission line signal output power doubled when compared to nonilluminated results. The experimental results are also reported for 100-W incident energy from a 1060-nm laser. Test results illustrate real-time signal processing would permit a structure to be controlled in response to incident radiation.
© 2016 Society of Photo-Optical Instrumentation Engineers (SPIE)
Deborah M. Mechtel, Deborah M. Mechtel, R. Brian Jenkins, R. Brian Jenkins, Peter J. Joyce, Peter J. Joyce, Charles L. Nelson, Charles L. Nelson, } "Radio frequency switching network: a technique for infrared sensing," Optical Engineering 55(10), 107106 (21 October 2016). https://doi.org/10.1117/1.OE.55.10.107106 . Submission:


RF switching network: a novel technique for IR sensing
Proceedings of SPIE (May 19 2016)
Finding markets for microstructures
Proceedings of SPIE (August 30 1998)
Diamond detectors for x-ray spectroscopy
Proceedings of SPIE (September 02 2008)
Prospective MEMS applications at NEC
Proceedings of SPIE (March 09 1999)

Back to Top