Vibration mode shapes visualization in industrial environment by real-time time-averaged phase-stepped electronic speckle pattern interferometry at 10.6  μm and shearography at 532 nm

Fabian Languy; Jean-François Vandenrijt; Cédric Thizy; Jonathan Rochet; Christophe Loffet; Daniel Simon; Marc P. Georges

doi:10.1117/1.OE.55.12.121704

1 June 2016 Vibration mode shapes visualization in industrial environment by real-time time-averaged phase-stepped electronic speckle pattern interferometry at 10.6 μm and shearography at 532 nm

Fabian Languy, Jean-François Vandenrijt, Cédric Thizy, Jonathan Rochet, Christophe Loffet, Daniel Simon, Marc P. Georges

Author Affiliations +

Optical Engineering, Vol. 55, Issue 12, 121704 (June 2016). https://doi.org/10.1117/1.OE.55.12.121704

Abstract

We present our investigations on two interferometric methods suitable for industrial conditions dedicated to the visualization of vibration modes of aeronautic blades. First, we consider long-wave infrared (LWIR) electronic speckle pattern interferometry (ESPI). The use of long wavelength allows measuring larger amplitudes of vibrations compared with what can be achieved with visible light. Also longer wavelengths allow lower sensitivity to external perturbations. Second, shearography at 532 nm is used as an alternative to LWIR ESPI. Both methods are used in time-averaged mode with the use of phase-stepping. This allows transforming Bessel fringes, typical to time averaging, into phase values that provide higher contrast and improve the visualization of vibration mode shapes. Laboratory experimental results with both techniques allowed comparison of techniques, leading to selection of shearography. Finally a vibration test on electrodynamic shaker is performed in an industrial environment and mode shapes are obtained with good quality by shearography.

Citation Download Citation

Fabian Languy, Jean-François Vandenrijt, Cédric Thizy, Jonathan Rochet, Christophe Loffet, Daniel Simon, and Marc P. Georges "Vibration mode shapes visualization in industrial environment by real-time time-averaged phase-stepped electronic speckle pattern interferometry at 10.6 μm and shearography at 532 nm," Optical Engineering 55(12), 121704 (1 June 2016). https://doi.org/10.1117/1.OE.55.12.121704

Published: 1 June 2016

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available