Measuring spatially varying, multispectral, ultraviolet bidirectional reflectance distribution function with an imaging spectrometer

Hongsong Li; Hang Lyu; Ningfang Liao; Wenmin Wu

doi:10.1117/1.OE.55.12.124106

22 December 2016 Measuring spatially varying, multispectral, ultraviolet bidirectional reflectance distribution function with an imaging spectrometer

Hongsong Li, Hang Lyu, Ningfang Liao, Wenmin Wu

Author Affiliations +

Optical Engineering, Vol. 55, Issue 12, 124106 (December 2016). https://doi.org/10.1117/1.OE.55.12.124106

Abstract

The bidirectional reflectance distribution function (BRDF) data in the ultraviolet (UV) band are valuable for many applications including cultural heritage, material analysis, surface characterization, and trace detection. We present a BRDF measurement instrument working in the near- and middle-UV spectral range. The instrument includes a collimated UV light source, a rotation stage, a UV imaging spectrometer, and a control computer. The data captured by the proposed instrument describe spatial, spectral, and angular variations of the light scattering from a sample surface. Such a multidimensional dataset of an example sample is captured by the proposed instrument and analyzed by a k-mean clustering algorithm to separate surface regions with same material but different surface roughnesses. The clustering results show that the angular dimension of the dataset can be exploited for surface roughness characterization. The two clustered BRDFs are fitted to a theoretical BRDF model. The fitting results show good agreement between the measurement data and the theoretical model.

CC BY: © The Authors. Published by SPIE under a Creative Commons Attribution 4.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.

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Hongsong Li, Hang Lyu, Ningfang Liao, and Wenmin Wu "Measuring spatially varying, multispectral, ultraviolet bidirectional reflectance distribution function with an imaging spectrometer," Optical Engineering 55(12), 124106 (22 December 2016). https://doi.org/10.1117/1.OE.55.12.124106

Received: 22 July 2016; Accepted: 29 November 2016; Published: 22 December 2016

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KEYWORDS

Bidirectional reflectance transmission function

Ultraviolet radiation

Spectroscopy

Light sources

Reflection

Sensors

Imaging systems

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