29 September 2016 Effects of heavy ion radiation on digital micromirror device performance
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Abstract
There is a pressing need in the astronomical community for space-suitable multiobject spectrometers (MOSs). Several digital micromirror device (DMD)-based prototype MOSs have been developed for ground-based observatories; however, their main use will come with deployment on a space-based mission. Therefore, the performance of DMDs under exoatmospheric radiation needs to be evaluated. DMDs were rewindowed with 2-μm thick pellicle and tested under accelerated heavy-ion radiation (control electronics shielded from radiation), with a focus on the detection of single-event effects (SEEs) including latch-up events. Testing showed that while DMDs are sensitive to nondestructive ion-induced state changes, all SEEs are cleared with a soft reset (i.e., sending a pattern to the device). The DMDs did not experience single-event induced permanent damage or functional changes that required a hard reset (power cycle), even at high ion fluences. This suggests that the SSE rate burden will be manageable for a DMD-based instrument when exposed to solar particle fluxes and cosmic rays in orbit.
© 2016 Society of Photo-Optical Instrumentation Engineers (SPIE)
Anton Travinsky, Dmitry Vorobiev, Zoran Ninkov, Alan D. Raisanen, Jonny Pellish, Massimo Robberto, Sara Heap, "Effects of heavy ion radiation on digital micromirror device performance," Optical Engineering 55(9), 094107 (29 September 2016). https://doi.org/10.1117/1.OE.55.9.094107 . Submission:
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