6 September 2016 Research on material removal accuracy analysis and correction of removal function during ion beam figuring
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Abstract
Material removal accuracy has a direct impact on the machining precision and efficiency of ion beam figuring. By analyzing the factors suppressing the improvement of material removal accuracy, we conclude that correcting the removal function deviation and reducing the removal material amount during each iterative process could help to improve material removal accuracy. Removal function correcting principle can effectively compensate removal function deviation between actual figuring and simulated processes, while experiments indicate that material removal accuracy decreases with a long machining time, so a small amount of removal material in each iterative process is suggested. However, more clamping and measuring steps will be introduced in this way, which will also generate machining errors and suppress the improvement of material removal accuracy. On this account, a free-measurement iterative process method is put forward to improve material removal accuracy and figuring efficiency by using less measuring and clamping steps. Finally, an experiment on a φ 100-mm Zerodur planar is preformed, which shows that, in similar figuring time, three free-measurement iterative processes could improve the material removal accuracy and the surface error convergence rate by 62.5% and 17.6%, respectively, compared with a single iterative process.
© 2016 Society of Photo-Optical Instrumentation Engineers (SPIE)
Weibin Wu, Yifan Dai, Lin Zhou, Mingjin Xu, "Research on material removal accuracy analysis and correction of removal function during ion beam figuring," Optical Engineering 55(9), 095101 (6 September 2016). https://doi.org/10.1117/1.OE.55.9.095101 . Submission:
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