4 April 2017 Errata: Model for thickness dependence of mobility and concentration in highly conductive zinc oxide
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Optical Engineering, 56(4), 049801 (2017). doi:10.1117/1.OE.56.4.049801
Abstract
This PDF file contains the errata for “OE Vol. 56 Issue 04 Paper OE-2017-0322-ERR” for OE Vol. 56 Issue 04
Look, Leedy, Kiefer, Claflin, Itagaki, Matsushima, and Suhariadi: Errata: Model for thickness dependence of mobility and concentration in highly conductive zinc oxide

This article [Opt. Eng. 52(3), 033801 (2013)] was originally published on 13 March 2013 with an error in the author list. The last author’s name was misspelled “Surhariadi.” The correct spelling appears above.

The paper was corrected on 23 March 2017.

David C. Look, Kevin D. Leedy, Arnold Kiefer, Bruce B. Claflin, Naho Itagaki, Koichi Matsushima, Iping Suhariadi, "Errata: Model for thickness dependence of mobility and concentration in highly conductive zinc oxide," Optical Engineering 56(4), 049801 (4 April 2017). http://dx.doi.org/10.1117/1.OE.56.4.049801
Submission: Received ; Accepted
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KEYWORDS
Zinc oxide

Analytical research

Sensors

Optical engineering

Electrical engineering

Information science

Aerospace engineering

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