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17 November 2017 Study of Cr/Sc-based multilayer reflecting mirrors using soft x-ray reflectivity and standing wave-enhanced x-ray fluorescence (Erratum)
Meiyi Wu, Catherine Burcklen, Jean-Michel André, Karine Le Guen, Angelo Giglia, Konstantin Koshmak, Stefano Nannarone, Françoise Bridou, Evgueni Meltchakov, Sébastien de Rossi, Franck Delmotte, Philippe Jonnard
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Optical Engineering, Vol. 56, Issue 11, 119801 (November 2017). https://doi.org/10.1117/1.OE.56.11.119801
Abstract
This erratum corrects a misspelling in the author list.

This article [Opt. Eng. 56(11), 117101 (2017)] was originally published on 1 November 2017 with an error in the author list. The 11th author’s name was misspelled. It is correctly spelled Franck Delmotte, as shown here.

The paper was corrected online on 7 November 2017. It appears correctly in print.
© 2017 Society of Photo-Optical Instrumentation Engineers (SPIE)
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Meiyi Wu, Catherine Burcklen, Jean-Michel André, Karine Le Guen, Angelo Giglia, Konstantin Koshmak, Stefano Nannarone, Françoise Bridou, Evgueni Meltchakov, Sébastien de Rossi, Franck Delmotte, and Philippe Jonnard "Study of Cr/Sc-based multilayer reflecting mirrors using soft x-ray reflectivity and standing wave-enhanced x-ray fluorescence (Erratum)," Optical Engineering 56(11), 119801 (17 November 2017). https://doi.org/10.1117/1.OE.56.11.119801
Published: 17 November 2017
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