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15 February 2017 Annual highlights
Michael T. Eismann
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Optical Engineering, Vol. 56, Issue 2, 020101 (February 2017). https://doi.org/10.1117/1.OE.56.2.020101
This PDF file contains the editorial “Annual highlights” for OE Vol. 56 Issue 02
© 2017 Society of Photo-Optical Instrumentation Engineers (SPIE)
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Michael T. Eismann "Annual highlights," Optical Engineering 56(2), 020101 (15 February 2017). https://doi.org/10.1117/1.OE.56.2.020101
Published: 15 February 2017
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KEYWORDS
Optical engineering
Freeform optics
Laser induced damage
Space telescopes
Ultrasonic non-destructive evaluation
Cameras
Laser metrology
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