Errata: Model for thickness dependence of mobility and concentration in highly conductive zinc oxide

David C. Look; Kevin D. Leedy; Arnold Kiefer; Bruce B. Claflin; Naho Itagaki; Koichi Matsushima; Iping Suhariadi

doi:10.1117/1.OE.56.4.049801

4 April 2017 Errata: Model for thickness dependence of mobility and concentration in highly conductive zinc oxide

David C. Look, Kevin D. Leedy, Arnold Kiefer, Bruce B. Claflin, Naho Itagaki, Koichi Matsushima, Iping Suhariadi

Author Affiliations +

Optical Engineering, Vol. 56, Issue 4, 049801 (April 2017). https://doi.org/10.1117/1.OE.56.4.049801

This PDF file contains the errata for “OE Vol. 56 Issue 04 Paper OE-2017-0322-ERR” for OE Vol. 56 Issue 04

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David C. Look, Kevin D. Leedy, Arnold Kiefer, Bruce B. Claflin, Naho Itagaki, Koichi Matsushima, and Iping Suhariadi "Errata: Model for thickness dependence of mobility and concentration in highly conductive zinc oxide," Optical Engineering 56(4), 049801 (4 April 2017). https://doi.org/10.1117/1.OE.56.4.049801

Published: 4 April 2017

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