Focus measure method based on the modulus of the gradient of the color planes for digital microscopy

Román Hurtado-Pérez; Carina Toxqui-Quitl; Alfonso Padilla-Vivanco; J. Félix Aguilar-Valdez; Gabriel Ortega-Mendoza

doi:10.1117/1.OE.57.2.023106

16 February 2018 Focus measure method based on the modulus of the gradient of the color planes for digital microscopy

Román Hurtado-Pérez, Carina Toxqui-Quitl, Alfonso Padilla-Vivanco, J. Félix Aguilar-Valdez, Gabriel Ortega-Mendoza

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Optical Engineering, Vol. 57, Issue 2, 023106 (February 2018). https://doi.org/10.1117/1.OE.57.2.023106

Abstract

The modulus of the gradient of the color planes (MGC) is implemented to transform multichannel information to a grayscale image. This digital technique is used in two applications: (a) focus measurements during autofocusing (AF) process and (b) extending the depth of field (EDoF) by means of multifocus image fusion. In the first case, the MGC procedure is based on an edge detection technique and is implemented in over 15 focus metrics that are typically handled in digital microscopy. The MGC approach is tested on color images of histological sections for the selection of in-focus images. An appealing attribute of all the AF metrics working in the MGC space is their monotonic behavior even up to a magnification of 100×. An advantage of the MGC method is its computational simplicity and inherent parallelism. In the second application, a multifocus image fusion algorithm based on the MGC approach has been implemented on graphics processing units (GPUs). The resulting fused images are evaluated using a nonreference image quality metric. The proposed fusion method reveals a high-quality image independently of faulty illumination during the image acquisition. Finally, the three-dimensional visualization of the in-focus image is shown.

CC BY: © The Authors. Published by SPIE under a Creative Commons Attribution 4.0 Unported License. Distribution or reproduction of this work in whole or in part requires full attribution of the original publication, including its DOI.

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Román Hurtado-Pérez, Carina Toxqui-Quitl, Alfonso Padilla-Vivanco, J. Félix Aguilar-Valdez, and Gabriel Ortega-Mendoza "Focus measure method based on the modulus of the gradient of the color planes for digital microscopy," Optical Engineering 57(2), 023106 (16 February 2018). https://doi.org/10.1117/1.OE.57.2.023106

Received: 4 July 2017; Accepted: 19 January 2018; Published: 16 February 2018

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