14 March 2018 Improved three-dimensional profile measuring method based on intensity-ratio measurement
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Abstract
In the existing intensity-ratio measuring methods, unwrapping the intensity ratio may be erroneous or even fail when measuring complex and isolated objects. This paper presents an improved three-dimensional (3-D) profile measuring method based on intensity-ratio measurement. Two shifting triangular patterns are projected to generate a triangular intensity-ratio distribution, and a Ronchi grating is projected to correctly divide the triangular intensity-ratio regions. Then, an absolute intensity ratio is retrieved point-by-point with the periodic label of the projected Ronchi grating. Finally, the intensity-ratio-to-height mapping algorithm is used to reconstruct the 3-D surface shape. The experimental results have demonstrated the feasibility and validity of the proposed method in restoring 3-D surface shape of the complex and isolated objects.
© 2018 Society of Photo-Optical Instrumentation Engineers (SPIE)
Zhoujie Wu, Qian Xiong, Fengjiao Li, Qican Zhang, "Improved three-dimensional profile measuring method based on intensity-ratio measurement," Optical Engineering 57(3), 034105 (14 March 2018). https://doi.org/10.1117/1.OE.57.3.034105 . Submission: Received: 24 October 2017; Accepted: 20 February 2018
Received: 24 October 2017; Accepted: 20 February 2018; Published: 14 March 2018
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