27 March 2019 Normalized quadrature four-frame phase shift algorithm based on crossed fringe patterns
Lei Tang, Dahai Li, Ruiyang Wang, Wuxiang Zhao, Jiangang Zhao
Author Affiliations +
Abstract
In the phase measurement deflectometry, sinusoidal fringe patterns are separately projected on a specular test surface, and the distorted fringes reflected by the surface are recorded by a charge-coupled device (CCD) camera. The phase shift algorithm is used to find the position of the light source on the display corresponding to the pixel point on the CCD, thereby calculating the slope of each point on the element to be tested, and finally retrieving the surface shape of the test element by using the surface reconstruction algorithm. The phase information is usually obtained by traditional 16-step phase-shifting algorithm, which involves certain complicated and time-consuming procedures, for instance, fringe projection in the horizontal and vertical directions. Therefore, to avoid these procedures, a four-step phase shift algorithm based on crossed fringes is proposed. Based on Gram–Schmidt orthonormalization method, only four crossed fringe patterns are needed to determine the phase in both directions simultaneously. Both numerical simulation and experiment are conducted to verify the validity of the algorithm.
© 2019 Society of Photo-Optical Instrumentation Engineers (SPIE) 0091-3286/2019/$25.00 © 2019 SPIE
Lei Tang, Dahai Li, Ruiyang Wang, Wuxiang Zhao, and Jiangang Zhao "Normalized quadrature four-frame phase shift algorithm based on crossed fringe patterns," Optical Engineering 58(3), 035103 (27 March 2019). https://doi.org/10.1117/1.OE.58.3.035103
Received: 29 October 2018; Accepted: 15 March 2019; Published: 27 March 2019
Lens.org Logo
CITATIONS
Cited by 3 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Phase shifts

Fringe analysis

Reconstruction algorithms

CCD cameras

Interferometers

Optical engineering

Phase measurement

RELATED CONTENT


Back to Top