5 April 2019 Reflection-mode digital gradient sensing method: measurement accuracy
Chengyun Miao, Hareesh V. Tippur
Author Affiliations +
Abstract
Surface topography evaluation from measured surface slopes is critical in many engineering applications, including metrology of electronic substrates, optical elements, and small deformation measurement of engineering structures subjected to external thermomechanical stimuli. A recently proposed noncontact full-field optical method called reflection-mode digital gradient sensing (r-DGS) is able to measure small angular deflections of light rays proportional to two orthogonal surface slopes. It has been shown that submicron scale deformations can be detected by processing the slope data using a robust numerical integration scheme called the higher-order finite-difference-based least-squares integration. However, the smallest measurable deformations and the associated accuracy are yet to be determined. In our work, this very issue is addressed by carrying out experiments at temporally different recording frequencies, namely (a) ultrahigh-speed digital photography at 106 frames per second (fps) and (b) slow recording speeds of 101  fps. The results show that r-DGS is able to measure submicron out-of-plane deformations under latter conditions and nanoscale deformations in the former conditions.
© 2019 Society of Photo-Optical Instrumentation Engineers (SPIE) 0091-3286/2019/$25.00 © 2019 SPIE
Chengyun Miao and Hareesh V. Tippur "Reflection-mode digital gradient sensing method: measurement accuracy," Optical Engineering 58(4), 044101 (5 April 2019). https://doi.org/10.1117/1.OE.58.4.044101
Received: 30 January 2019; Accepted: 11 March 2019; Published: 5 April 2019
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Speckle

Semiconducting wafers

Silicon

Cameras

Digital image correlation

Optical engineering

Photography

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