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15 October 2019 Optical cryostat with sample rotating unit for polarization-sensitive terahertz and infrared spectroscopy
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Abstract

We developed an optical cryostat with a sample-rotation unit for polarization-sensitive measurement in terahertz (THz) and infrared (IR) ranges. The cryostat, in combination with two metal-grid polarizers, provides full control of mutual orientation of the sample’s crystallographic axes and the light polarization plane. Importantly, this control is realized in-situ, i.e., during the sample cooling–heating cycle. To demonstrate the abilities of the developed cryostat, we used it in combination with a laboratory-made THz time-domain spectrometer, for polarization-sensitive measurements of an orthoferrite (YFeO3) in the range of 5 to 50  cm  −  1. These measurements revealed strong angular dependence of the sample transmission. The developed cryostat is capable for solving numerous demanding problems of THz and IR spectroscopy in condensed matter physics and materials science, biophysics, chemical, and pharmaceutical sciences.

© 2019 Society of Photo-Optical Instrumentation Engineers (SPIE) 0091-3286/2019/$28.00 © 2019 SPIE
Gennady A. Komandin, Vladimir B. Anzin, Vladislav E. Ulitko, Arseniy A. Gavdush, Alexander A. Mukhin, Yurii G. Goncharov, Oleg E. Porodinkov, and Igor E. Spektor "Optical cryostat with sample rotating unit for polarization-sensitive terahertz and infrared spectroscopy," Optical Engineering 59(6), 061603 (15 October 2019). https://doi.org/10.1117/1.OE.59.6.061603
Received: 9 August 2019; Accepted: 17 September 2019; Published: 15 October 2019
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