SPIE Seminar Highlights Photo-optical Systems Evaluation

Brian J. Thompson

doi:10.1117/12.7971377

2 March 1968 SPIE Seminar Highlights Photo-optical Systems Evaluation

Brian J. Thompson

Author Affiliations +

Optical Engineering, Vol. 6, Issue 3, 060389 (March 1968). https://doi.org/10.1117/12.7971377

Abstract

The photo-optical systems evaluation seminar-in-depth held in Rochester, New York on May 11, 1967 consists of a two day meeting during which 15 technical papers were presented. The seminar was assessed during a lively colloquium at the end of the second day. In this brief review of the seminar, the main advances in instrumentation and analytical techniques will be described. However, the most important task is to attempt to summarize the feelings of the participants and to point out some of the problem areas that this seminar uncovered.

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Brian J. Thompson "SPIE Seminar Highlights Photo-optical Systems Evaluation," Optical Engineering 6(3), 060389 (2 March 1968). https://doi.org/10.1117/12.7971377

Published: 2 March 1968

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