Special Section on Quality Control by Artificial Vision
Yan Zhang, Andreas Koschan, Mongi Abidi
J. Electron. Imag. 13(3), (1 July 2004) https://doi.org/10.1117/1.1762516
TOPICS: Image segmentation, 3D modeling, 3D image processing, Neck, Object recognition, Detection and tracking algorithms, Computer graphics, Machine vision, Computer vision technology
J. Electron. Imag. 13(3), (1 July 2004) https://doi.org/10.1117/1.1760758
TOPICS: Image processing, Feature extraction, Cameras, Fractal analysis, Edge detection, Image acquisition, Imaging systems, Laser systems engineering, 3D modeling, Statistical modeling
J. Electron. Imag. 13(3), (1 July 2004) https://doi.org/10.1117/1.1762518
TOPICS: Image segmentation, Semiconducting wafers, Image processing, Wavelets, Wafer inspection, Photomasks, Semiconductors, Inspection, Signal to noise ratio, Wavelet transforms
Jean-Michel Létang, Nicolas Freud, Gilles Peix
J. Electron. Imag. 13(3), (1 July 2004) https://doi.org/10.1117/1.1760083
TOPICS: Signal to noise ratio, Glasses, X-rays, X-ray imaging, Calibration, Quality measurement, Signal attenuation, Sensors, Polymethylmethacrylate, Data modeling
Thomas Heger, Madhukar Pandit
J. Electron. Imag. 13(3), (1 July 2004) https://doi.org/10.1117/1.1760757
TOPICS: Image segmentation, Image fusion, Wavelets, Wavelet transforms, Inspection, Image processing, Imaging systems, 3D image processing, 3D acquisition, Surface finishing
Alex Lallement, Redouane Khemmar, Ernest Hirsch
J. Electron. Imag. 13(3), (1 July 2004) https://doi.org/10.1117/1.1762517
TOPICS: Image segmentation, Image processing, Inspection, 3D image processing, Manufacturing, Data acquisition, Image resolution, 3D modeling, Binary data, Image analysis
J. Electron. Imag. 13(3), (1 July 2004) https://doi.org/10.1117/1.1763586
TOPICS: Feature extraction, Scanning electron microscopy, Principal component analysis, Image processing, Databases, Semiconductors, Semiconducting wafers, Error analysis, Imaging systems, Process control
J. Electron. Imag. 13(3), (1 July 2004) https://doi.org/10.1117/1.1762520
TOPICS: Image filtering, Optimal filtering, Binary data, Image processing, Algorithm development, Error analysis, Transform theory, Image resolution, Electronic filtering, Nonlinear filtering
Paul O'Leary, Paul Zsombor-Murray
J. Electron. Imag. 13(3), (1 July 2004) https://doi.org/10.1117/1.1758951
TOPICS: Inspection, Scanning probe lithography, MATLAB, Numerical stability, Matrices, Data modeling, Image processing, Numerical simulations, Distance measurement, Statistical analysis
J. Electron. Imag. 13(3), (1 July 2004) https://doi.org/10.1117/1.1762519
TOPICS: Image processing, Telecommunications, Data communications, Distributed computing, Sensors, Cameras, Automatic control, Control systems, Imaging systems, Image quality
Khoudeir Majdi, Jacques Brochard, Anis Benslimane, Min-Tan Do
J. Electron. Imag. 13(3), (1 July 2004) https://doi.org/10.1117/1.1762522
TOPICS: Roads, Sensors, Gaussian filters, Cameras, Image filtering, Image analysis, Surface roughness, Coating, Safety, Reflectivity
Besma Abidi, Jimin Liang, Mark Mitckes, Mongi Abidi
J. Electron. Imag. 13(3), (1 July 2004) https://doi.org/10.1117/1.1760571
TOPICS: Image segmentation, Image enhancement, X-rays, X-ray imaging, Image processing, Radon transform, Weapons, Visualization, Image processing algorithms and systems, Data processing
Christophe Rosenberger, B. Emile, H. Laurent
J. Electron. Imag. 13(3), (1 July 2004) https://doi.org/10.1117/1.1760082
TOPICS: Control systems, Software development, Image quality, Machine vision, Image processing, Actuators, Sensors, Cameras, Light sources and illumination, Calibration
J. Electron. Imag. 13(3), (1 July 2004) https://doi.org/10.1117/1.1760756
TOPICS: Optical filters, Multispectral imaging, Reflectivity, Charge-coupled devices, Neural networks, Cameras, Neurons, Spatial resolution, Visible radiation, Image processing
J. Fu, H. John Caulfield, S. Pulusani
J. Electron. Imag. 13(3), (1 July 2004) https://doi.org/10.1117/1.1760081
TOPICS: Color vision, Cameras, CCD cameras, Optical filters, Beam splitters, Image processing, Brain, Machine vision, Human vision and color perception, Signal detection
Olivier Aubreton, Benaissa Bellach, Lew Lew Yan Voon, Bernard Lamalle, Patrick Gorria, Guy Cathebras
J. Electron. Imag. 13(3), (1 July 2004) https://doi.org/10.1117/1.1762886
TOPICS: Retina, Image analysis, Sensors, Binary data, Transistors, Photomasks, Photodiodes, CMOS technology, Computer programming, Standards development
Olivier Laligant, Remy Leconge, Frédéric Truchetet, Olivier Mahu, Alain Diou
J. Electron. Imag. 13(3), (1 July 2004) https://doi.org/10.1117/1.1762521
TOPICS: Head, Motion estimation, Eye, Iris recognition, Light sources and illumination, Cameras, Spherical lenses, 3D image reconstruction, 3D image processing, Image processing
Image and Video Enhancement
Ziya Telatar
J. Electron. Imag. 13(3), (1 July 2004) https://doi.org/10.1117/1.1758271
TOPICS: Image filtering, Image restoration, Image quality, Image processing, Gaussian filters, Medical imaging, Statistical modeling, Photography, Convolution, Point spread functions
J. Electron. Imag. 13(3), (1 July 2004) https://doi.org/10.1117/1.1762889
TOPICS: Cameras, Resolution enhancement technologies, Image enhancement, Video, Image resolution, Super resolution, Point spread functions, Image analysis, Error analysis, Motion estimation
William Glenn
J. Electron. Imag. 13(3), (1 July 2004) https://doi.org/10.1117/1.1762887
TOPICS: Image resolution, Televisions, Spatial frequencies, Visualization, Cameras, Visual system, Contrast sensitivity, Image filtering, Optical filters, Modulation transfer functions
Byoungki Jeon, JeongHun Jang, KiSang Hong
J. Electron. Imag. 13(3), (1 July 2004) https://doi.org/10.1117/1.1758952
TOPICS: Image segmentation, Palladium, Image processing algorithms and systems, Edge detection, Binary data, Control systems, Anisotropic diffusion, Fused deposition modeling, Computer engineering, Ridge detection
Image Segmentation and Analysis
Antonio Jiménez Ruiz, Eskarne Laizola Loinaz, Fernando Morgado, Mar Calvache Sánchez, Fernando Granja
J. Electron. Imag. 13(3), (1 July 2004) https://doi.org/10.1117/1.1762888
TOPICS: Glasses, Cameras, Image segmentation, Control systems, Computing systems, Calibration, Machine vision, Computer vision technology, Process control, Imaging systems
Color Image Processing
J. Electron. Imag. 13(3), (1 July 2004) https://doi.org/10.1117/1.1762890
TOPICS: Image filtering, Optical filters, RGB color model, Color image processing, Error analysis, Distortion, Binary data, Image segmentation, Digital imaging, Speckle
Ryoichi Saito, Hiroaki Kotera
J. Electron. Imag. 13(3), (1 July 2004) https://doi.org/10.1117/1.1758727
TOPICS: Printing, Image segmentation, 3D image processing, 3D printing, CRTs, Image compression, 3D displays, Associative arrays, Image processing
Halftoning, Compression, and Cryptography
Yuk-Hee Chan, Sin-Min Cheung
J. Electron. Imag. 13(3), (1 July 2004) https://doi.org/10.1117/1.1758728
TOPICS: Diffusion, Image processing, Error analysis, Computer simulations, Quantization, Image filtering, Image quality, Halftones, Digital imaging, Filtering (signal processing)
J. Electron. Imag. 13(3), (1 July 2004) https://doi.org/10.1117/1.1762891
TOPICS: Wavelets, Error analysis, Image compression, Image transmission, Data compression, Image quality, Receivers, Computer programming, Forward error correction, Distortion
J. Electron. Imag. 13(3), (1 July 2004) https://doi.org/10.1117/1.1758729
TOPICS: Visualization, Cryptography, Transparency, Tolerancing, Image registration, Binary data, Opacity, Image enhancement, Information security, Image quality
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