1 July 2007 Rank-ordered error diffusion: method and applications
Author Affiliations +
Abstract
We present a specialized form of error diffusion (ED) that addresses certain long-standing problems associated with operating on images possessing halftone structure and other local high-contrast structures. For instance, image-quality defects often occur when rendering a scanned halftone image to printable form via quantization reduction. Rendering the scanned halftone via conventional ED produces fragmented dots, which can appear grainy and be unstable in printed density. Rendering by thresholding or rehalftoning often produces moiré, and descreening blurs the image. Another difficulty arises in printers that utilize a binary image path, where an image is rasterized directly to halftone form. In that form it is difficult to perform basic image processing operations such as applying a digital tone reproduction curve. Rank-order error diffusion (ROED) has been developed to address these problems. ROED utilizes brightness ranking of pixels within a diffusion mask to diffuse quantization error at a pixel. This approach results in an image-structure-adaptive quantization with useful properties. We describe the basic methodology of ROED as well as several applications in processing halftone images.
©(2007) Society of Photo-Optical Instrumentation Engineers (SPIE)
Robert P. Loce and Beilei Xu "Rank-ordered error diffusion: method and applications," Journal of Electronic Imaging 16(3), 033001 (1 July 2007). https://doi.org/10.1117/1.2768603
Published: 1 July 2007
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Halftones

Diffusion

Image processing

Quantization

Printing

Binary data

Error analysis

RELATED CONTENT

Improved error diffusion method
Proceedings of SPIE (October 28 1992)
Rank-ordered error diffusion: method and applications
Proceedings of SPIE (January 29 2007)
Error diffusion techniques for printing fingerprint images
Proceedings of SPIE (January 28 1997)

Back to Top