Journal of Electronic Imaging
VOL. 17 · NO. 3 | July 2008
JEI Letters
J. Electron. Imag. 17 (3), 030501 (1 July 2008)
TOPICS: Infrared radiation, Infrared imaging, Image enhancement, Target recognition, Target detection, 3D image enhancement, 3D acquisition, Signal to noise ratio, Optical filters, Image filtering
J. Electron. Imag. 17 (3), 030502 (1 July 2008)
TOPICS: Image retrieval, 3D image processing, Heart, Medical imaging, Data acquisition, Wavelets, Image registration, Databases, Rigid registration, Feature extraction
J. Electron. Imag. 17 (3), 030503 (1 July 2008)
TOPICS: Feature extraction, Image filtering, Fourier transforms, Image processing, Image retrieval, Phase shifts, Remote sensing, Signal to noise ratio, Machine vision, Computer vision technology
Special Section on Quality Control by Artificial Vision
J. Electron. Imag. 17 (3), 031101 (1 July 2008)
J. Electron. Imag. 17 (3), 031102 (1 July 2008)
TOPICS: Wavelets, Signal processing, Wavelet transforms, Discrete wavelet transforms, Image compression, Image processing, Analytical research, Statistical analysis, Video compression, Feature extraction
J. Electron. Imag. 17 (3), 031103 (1 July 2008)
TOPICS: 3D modeling, Cameras, Error analysis, Machine vision, Sensors, Computer vision technology, 3D image processing, 3D vision, Motion estimation, Digital Light Processing
Quality Control by Artificial Vision
J. Electron. Imag. 17 (3), 031104 (1 July 2008)
TOPICS: Detection and tracking algorithms, Target detection, Defect detection, Inspection, Receivers, Fuzzy logic, Image processing, Binary data, Imaging systems, Image quality
Special Section on Quality Control by Artificial Vision
J. Electron. Imag. 17 (3), 031105 (1 July 2008)
TOPICS: Mirrors, Calibration, 3D image processing, Combined lens-mirror systems, Polarization, Sensors, Cameras, Imaging systems, Dielectric polarization, Sensor calibration
J. Electron. Imag. 17 (3), 031106 (1 July 2008)
TOPICS: RGB color model, Statistical modeling, Ceramics, Data modeling, Principal component analysis, Feature extraction, Error analysis, Databases, Image classification, Statistical analysis
J. Electron. Imag. 17 (3), 031107 (1 July 2008)
TOPICS: Visibility, Visualization, Thin films, Transistors, Inspection, Defect detection, Detection and tracking algorithms, Liquid crystals, LCDs, Feature extraction
J. Electron. Imag. 17 (3), 031108 (1 July 2008)
TOPICS: 3D image processing, Composites, Detection and tracking algorithms, Signal to noise ratio, Image segmentation, X-rays, Synchrotrons, Data acquisition, Synchrotron radiation, Image processing algorithms and systems
J. Electron. Imag. 17 (3), 031109 (1 July 2008)
TOPICS: Imaging systems, Velocity measurements, Particles, Image processing, Image acquisition, Binary data, Hough transforms, Light sources and illumination, Digital filtering, Image filtering
Quality Control by Artificial Vision
J. Electron. Imag. 17 (3), 031110 (1 July 2008)
TOPICS: Optical fibers, Imaging systems, Image processing, Image segmentation, Scanners, Computing systems, Adaptive control, Image filtering, Image restoration, Prototyping
Regular Articles
J. Electron. Imag. 17 (3), 033001 (1 July 2008)
TOPICS: LCDs, Defect detection, Visibility, Human vision and color perception, Inspection, Image filtering, CCD cameras, Visualization, Statistical analysis, Image segmentation
J. Electron. Imag. 17 (3), 033002 (1 July 2008)
TOPICS: Image quality, Databases, Molybdenum, Data modeling, Performance modeling, Chromium, Image compression, JPEG2000, Mathematical modeling, Image processing
J. Electron. Imag. 17 (3), 033003 (1 July 2008)
TOPICS: Quality measurement, Reflectivity, Laser range finders, Scanners, Spatial resolution, Image quality, Sensors, Laser scanners, Speckle, 3D scanning
J. Electron. Imag. 17 (3), 033004 (1 July 2008)
TOPICS: Image quality, Image processing, Associative arrays, Image compression, Printing, Image classification, RGB color model, Image quality standards, Feature selection, Color management
J. Electron. Imag. 17 (3), 033005 (1 July 2008)
TOPICS: Statistical analysis, Image enhancement, Error analysis, Photography, Color management, Image quality, Image quality standards, Neural networks, Cameras, Video
J. Electron. Imag. 17 (3), 033006 (1 July 2008)
TOPICS: Image compression, Wavelets, Wavelet transforms, Computer programming, Image quality, Reconstruction algorithms, Signal to noise ratio, Discrete wavelet transforms, JPEG2000, Lithium
J. Electron. Imag. 17 (3), 033007 (1 July 2008)
TOPICS: Wavelets, Discrete wavelet transforms, Lithium, Laser induced plasma spectroscopy, Image compression, Computer engineering, Wavelet transforms, Computer programming, Image information entropy, Video coding
J. Electron. Imag. 17 (3), 033008 (1 July 2008)
TOPICS: Digital watermarking, Image restoration, Image quality, Image compression, Visualization, Image enhancement, JPEG2000, Image retrieval, Image processing, Image filtering
J. Electron. Imag. 17 (3), 033009 (1 July 2008)
TOPICS: Digital watermarking, Image quality, Image processing, Image compression, Visualization, Image transmission, Digital imaging, Image storage, Feature extraction
J. Electron. Imag. 17 (3), 033010 (1 July 2008)
TOPICS: Digital watermarking, Multimedia, Feature extraction, Quantization, Wavelets, JPEG2000, Discrete wavelet transforms, Image compression, Computer security, Information security
J. Electron. Imag. 17 (3), 033011 (1 July 2008)
TOPICS: Reconstruction algorithms, Image restoration, 3D image processing, 3D image reconstruction, Image resolution, Signal attenuation, Optimization (mathematics), Annealing, X-rays, X-ray imaging
J. Electron. Imag. 17 (3), 033012 (1 July 2008)
TOPICS: Digital filtering, Image filtering, Temperature metrology, Edge detection, Line scan image sensors, Electronic filtering, Image processing, Interference (communication), Nonlinear filtering, Infrared radiation
J. Electron. Imag. 17 (3), 033013 (1 July 2008)
TOPICS: Synthetic aperture radar, Data modeling, Automatic target recognition, Image classification, Principal component analysis, Image fusion, Radar, Target recognition, Reflectivity, Visualization
J. Electron. Imag. 17 (3), 033014 (1 July 2008)
TOPICS: Inspection, Image segmentation, 3D image processing, Image classification, Cameras, Sensors, Image processing, Reflectivity, Optical inspection, Light sources and illumination
J. Electron. Imag. 17 (3), 033015 (1 July 2008)
TOPICS: Cameras, Spherical lenses, Motion estimation, Digital cameras, Camera shutters, Motion measurement, CCD cameras, Motion models, Sensors, Image processing
J. Electron. Imag. 17 (3), 033016 (1 July 2008)
TOPICS: Image segmentation, Feature extraction, Digital imaging, Image processing algorithms and systems, Image compression, Image classification, Image retrieval, Databases, Error analysis, Information visualization
J. Electron. Imag. 17 (3), 033017 (1 July 2008)
TOPICS: Distance measurement, Fuzzy logic, Genetic algorithms, Glasses, Iris recognition, Data storage, Databases, Computer science, Information science, Machine learning
J. Electron. Imag. 17 (3), 033018 (1 July 2008)
TOPICS: Optimal filtering, Image compression, Image filtering, Receivers, Quantization, Brain-machine interfaces, Filtering (signal processing), Computer programming, Transform theory, Wavelets
J. Electron. Imag. 17 (3), 033019 (1 July 2008)
TOPICS: Video, Digital signal processing, Video compression, Motion estimation, Binary data, Computer programming, Detection and tracking algorithms, Motion detection, Motion models, Video coding
J. Electron. Imag. 17 (3), 033021 (1 July 2008)
TOPICS: Denoising, Transform theory, Statistical analysis, Wavelets, Image denoising, Statistical modeling, Error analysis, Polonium, Image quality, Global system for mobile communications
J. Electron. Imag. 17 (3), 039801 (1 July 2008)
Book Reviews
J. Electron. Imag. 17 (3), 039901 (1 July 2008)
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