Learning local feature descriptors through ranking losses improved by variance shrinkage

Dalong Zhang; Lei Zhao; Wei Li; Duanqing Xu; Dongming Lu

doi:10.1117/1.JEI.27.3.033016

18 May 2018 Learning local feature descriptors through ranking losses improved by variance shrinkage

Dalong Zhang, Lei Zhao, Wei Li, Duanqing Xu, Dongming Lu

Author Affiliations +

Journal of Electronic Imaging, Vol. 27, Issue 3, 033016 (May 2018). https://doi.org/10.1117/1.JEI.27.3.033016

Abstract

This work proposes an improved ranking model of learning local feature descriptors for matching image patches by introducing a variance shrinkage constraint. Previous ranking losses, such as triplet ranking loss and quadruplet ranking loss, have proven powerful in separating corresponding patch pairs from noncorresponding ones. However, they are unable to restrict the intraclass variation since they are only designed to keep noncorresponding pairs away from corresponding ones. Consequently, those scattered pairs get mixed up near the separating hyperplane, which are difficult to discriminate and may disrupt the performance. To resolve this problem, we introduce a variance shrinkage constraint that aims to reduce the variance of patch pairs in the same class and force them to be close to each other. The combination of ranking losses and the variance shrinkage constraint can efficiently reduce overlaps between patch pairs of different classes, which is confirmed by our experiments. Experiments also show that our model achieves a significant improvement in performance compared with original ranking models and other latest methods.

Citation Download Citation

Dalong Zhang, Lei Zhao, Wei Li, Duanqing Xu, and Dongming Lu "Learning local feature descriptors through ranking losses improved by variance shrinkage," Journal of Electronic Imaging 27(3), 033016 (18 May 2018). https://doi.org/10.1117/1.JEI.27.3.033016

Received: 27 November 2017; Accepted: 2 May 2018; Published: 18 May 2018

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KEYWORDS

3D modeling

Performance modeling

Visual process modeling

Data modeling

Statistical modeling

Neodymium

Distance measurement

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