Journal of Electronic Imaging
VOL. 29 · NO. 4 | July 2020
SPIE publishes accepted journal articles as soon as they are approved for publication. Journal issues are considered In Progress until all articles for an issue have been published. Articles published ahead of the completed issue are fully citable.
Special Section on Quality Control by Artificial Vision VI
J. Electron. Imag. 29(4), 041002 (28 December 2019)
TOPICS: Skin, Image classification, Neural networks, Injuries, Feature extraction, Data modeling, Ultraviolet radiation, Diagnostics, Algorithm development, Surgery
J. Electron. Imag. 29(4), 041003 (31 December 2019)
TOPICS: Skin, Computing systems, Image segmentation, Light sources and illumination, Picosecond phenomena, Image processing, Image acquisition, RGB color model, Calibration, Mouse models
J. Electron. Imag. 29(4), 041004 (11 January 2020)
TOPICS: Light sources, Reflectivity, Digital micromirror devices, Calibration, Spherical lenses, Visualization, Solids, Statistical analysis, Data modeling, Error analysis
J. Electron. Imag. 29(4), 041005 (20 January 2020)
TOPICS: Model-based design, Data modeling, Computer programming, Molybdenum, 3D modeling, Inspection, Lawrencium, Video, Performance modeling, Binary data
J. Electron. Imag. 29(4), 041006 (17 January 2020)
TOPICS: Polarization, Cameras, Reflection, Imaging systems, 3D acquisition, 3D modeling, Sensors, Visualization, Error analysis, Polarization analysis
J. Electron. Imag. 29(4), 041007 (4 February 2020)
TOPICS: Image segmentation, Inspection, Cameras, Modulation, Data modeling, Computer programming, LCDs, Image processing, Convolutional neural networks, Defect detection
J. Electron. Imag. 29(4), 041008 (17 February 2020)
TOPICS: Clouds, Sensors, 3D modeling, Inspection, Environmental sensing, Solid modeling, Data modeling, Computer aided design, RGB color model, Chemical elements
J. Electron. Imag. 29(4), 041009 (21 February 2020)
TOPICS: Sensors, Video, Glasses, X-rays, RGB color model, Cameras, Inspection, Optical filters, X-ray technology, Algorithm development
J. Electron. Imag. 29(4), 041010 (3 March 2020)
TOPICS: Data modeling, Neural networks, Prototyping, Image classification, Unmanned aerial vehicles, Machine learning, Defect detection, Inspection, 3D modeling, Optical inspection
J. Electron. Imag. 29(4), 041011 (5 March 2020)
TOPICS: Calibration, Polarization, Cameras, Optical filters, Polarimetry, Sensors, Image filtering, Error analysis, Imaging arrays, Radio optics
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