Journal of Electronic Imaging
VOL. 29 · NO. 4 | July 2020
ISSUES IN PROGRESS
IN PROGRESS
SPIE publishes accepted journal articles as soon as they are approved for publication. Journal issues are considered In Progress until all articles for an issue have been published. Articles published ahead of the completed issue are fully citable.
Special Section on Quality Control by Artificial Vision VI
J. Electron. Imag. 29(4), 041002 (28 December 2019) https://doi.org/10.1117/1.JEI.29.4.041002
TOPICS: Skin, Image classification, Neural networks, Injuries, Feature extraction, Data modeling, Ultraviolet radiation, Diagnostics, Algorithm development, Surgery
J. Electron. Imag. 29(4), 041003 (31 December 2019) https://doi.org/10.1117/1.JEI.29.4.041003
TOPICS: Skin, Computing systems, Image segmentation, Light sources and illumination, Picosecond phenomena, Image processing, Image acquisition, RGB color model, Calibration, Mouse models
J. Electron. Imag. 29(4), 041004 (11 January 2020) https://doi.org/10.1117/1.JEI.29.4.041004
TOPICS: Light sources, Reflectivity, Digital micromirror devices, Calibration, Spherical lenses, Visualization, Solids, Statistical analysis, Data modeling, Error analysis
J. Electron. Imag. 29(4), 041005 (20 January 2020) https://doi.org/10.1117/1.JEI.29.4.041005
TOPICS: Model-based design, Data modeling, Computer programming, Molybdenum, 3D modeling, Inspection, Lawrencium, Video, Performance modeling, Binary data
J. Electron. Imag. 29(4), 041006 (17 January 2020) https://doi.org/10.1117/1.JEI.29.4.041006
TOPICS: Polarization, Cameras, Reflection, Imaging systems, 3D acquisition, 3D modeling, Sensors, Visualization, Error analysis, Polarization analysis
J. Electron. Imag. 29(4), 041007 (4 February 2020) https://doi.org/10.1117/1.JEI.29.4.041007
TOPICS: Image segmentation, Inspection, Cameras, Modulation, Data modeling, Computer programming, LCDs, Image processing, Convolutional neural networks, Defect detection
J. Electron. Imag. 29(4), 041008 (17 February 2020) https://doi.org/10.1117/1.JEI.29.4.041008
TOPICS: Clouds, Sensors, 3D modeling, Inspection, Environmental sensing, Solid modeling, Data modeling, Computer aided design, RGB color model, Chemical elements
J. Electron. Imag. 29(4), 041009 (21 February 2020) https://doi.org/10.1117/1.JEI.29.4.041009
TOPICS: Sensors, Video, Glasses, X-rays, RGB color model, Cameras, Inspection, Optical filters, X-ray technology, Algorithm development
J. Electron. Imag. 29(4), 041010 (3 March 2020) https://doi.org/10.1117/1.JEI.29.4.041010
TOPICS: Data modeling, Neural networks, Prototyping, Image classification, Unmanned aerial vehicles, Machine learning, Defect detection, Inspection, 3D modeling, Optical inspection
J. Electron. Imag. 29(4), 041011 (5 March 2020) https://doi.org/10.1117/1.JEI.29.4.041011
TOPICS: Calibration, Polarization, Cameras, Optical filters, Polarimetry, Sensors, Image filtering, Error analysis, Imaging arrays, Radio optics
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