Journal of Electronic Imaging
VOL. 29 · NO. 4 | July 2020
Special Section on Quality Control by Artificial Vision VI
J. Electron. Imag. 29(4), 041002 (28 December 2019)
TOPICS: Skin, Image classification, Neural networks, Injuries, Feature extraction, Data modeling, Ultraviolet radiation, Diagnostics, Algorithm development, Surgery
J. Electron. Imag. 29(4), 041003 (31 December 2019)
TOPICS: Skin, Computing systems, Image segmentation, Light sources and illumination, Picosecond phenomena, Image processing, Image acquisition, RGB color model, Calibration, Mouse models
J. Electron. Imag. 29(4), 041004 (11 January 2020)
TOPICS: Light sources, Reflectivity, Digital micromirror devices, Calibration, Spherical lenses, Visualization, Solids, Statistical analysis, Data modeling, Error analysis
J. Electron. Imag. 29(4), 041005 (20 January 2020)
TOPICS: Model-based design, Data modeling, Computer programming, Molybdenum, 3D modeling, Inspection, Lawrencium, Video, Performance modeling, Binary data
J. Electron. Imag. 29(4), 041006 (17 January 2020)
TOPICS: Polarization, Cameras, Reflection, Imaging systems, 3D acquisition, 3D modeling, Sensors, Visualization, Error analysis, Polarization analysis
J. Electron. Imag. 29(4), 041007 (4 February 2020)
TOPICS: Image segmentation, Inspection, Cameras, Modulation, Data modeling, Computer programming, LCDs, Image processing, Convolutional neural networks, Defect detection
J. Electron. Imag. 29(4), 041008 (17 February 2020)
TOPICS: Clouds, Sensors, 3D modeling, Inspection, Environmental sensing, Solid modeling, Data modeling, Computer aided design, RGB color model, Chemical elements
J. Electron. Imag. 29(4), 041009 (21 February 2020)
TOPICS: Sensors, Video, Glasses, X-rays, RGB color model, Cameras, Inspection, Optical filters, X-ray technology, Algorithm development
J. Electron. Imag. 29(4), 041010 (3 March 2020)
TOPICS: Data modeling, Neural networks, Prototyping, Image classification, Unmanned aerial vehicles, Machine learning, Defect detection, Inspection, 3D modeling, Optical inspection
J. Electron. Imag. 29(4), 041011 (5 March 2020)
TOPICS: Calibration, Polarization, Cameras, Optical filters, Polarimetry, Sensors, Image filtering, Error analysis, Imaging arrays, Radio optics
J. Electron. Imag. 29(4), 041012 (25 April 2020)
TOPICS: Clouds, 3D modeling, Inspection, Solid modeling, Computer aided design, Data modeling, 3D scanning, RGB color model, Image segmentation, Scanners
J. Electron. Imag. 29(4), 041013 (28 April 2020)
TOPICS: Inspection, X-rays, X-ray imaging, X-ray computed tomography, Feature extraction, Statistical modeling, Binary data, Neural networks, Error analysis, Defect detection
J. Electron. Imag. 29(4), 041014 (8 August 2020)
TOPICS: Polarimetry, Polarization, Sensors, Reflection, Cameras, Manufacturing, Feature extraction, Imaging systems, Image quality
Regular Articles
J. Electron. Imag. 29(4), 043001 (6 July 2020)
TOPICS: RGB color model, Gallium nitride, Data modeling, Feature extraction, Image fusion, Computer programming, Convolution, Visualization, Image processing
J. Electron. Imag. 29(4), 043002 (7 July 2020)
TOPICS: Data modeling, Chromium, Video, Statistical modeling, Error analysis, Expectation maximization algorithms, Head, Feature extraction, Databases
J. Electron. Imag. 29(4), 043003 (9 July 2020)
TOPICS: Calibration, Cameras, Microlens, Image sensors, Sensors, Microlens array, Vignetting, Signal to noise ratio, RGB color model
J. Electron. Imag. 29(4), 043004 (10 July 2020)
TOPICS: Defect detection, Magnetism, Convolution, Image processing, Convolutional neural networks, Inspection, Image enhancement, Data modeling, Performance modeling
J. Electron. Imag. 29(4), 043005 (10 July 2020)
TOPICS: Denoising, Convolution, Feature extraction, Image denoising, Performance modeling, Image filtering, Signal to noise ratio, Visualization, Image segmentation
J. Electron. Imag. 29(4), 043006 (15 July 2020)
TOPICS: Image restoration, Image fusion, Image transmission, Signal attenuation, Image enhancement, Light scattering, Scattering, Light sources, Absorption
J. Electron. Imag. 29(4), 043007 (16 July 2020)
TOPICS: Video, Digital watermarking, Cameras, Binary data, Detection and tracking algorithms, Steganography, Signal processing, Speckle, Video compression
J. Electron. Imag. 29(4), 043008 (17 July 2020)
TOPICS: Light emitting diodes, Cameras, Reflectivity, Sensors, Seaborgium, Optical filters, Error analysis, Calibration, LED lighting
J. Electron. Imag. 29(4), 043009 (20 July 2020)
TOPICS: Visualization, Image segmentation, Convolutional neural networks, Neural networks, Detection and tracking algorithms, Optical character recognition, Feature extraction, Surveillance, Image classification
J. Electron. Imag. 29(4), 043010 (20 July 2020)
TOPICS: Image restoration, Air contamination, Image fusion, Atmospheric modeling, Denoising, Image processing, Light sources, Lithium, Scattering
J. Electron. Imag. 29(4), 043011 (21 July 2020)
TOPICS: Image quality, Databases, Visualization, Feature extraction, Distortion, Image processing, Image fusion, Image visualization, Remote sensing
J. Electron. Imag. 29(4), 043012 (24 July 2020)
TOPICS: Sensors, Feature extraction, Testing and analysis, Stars, Statistical modeling, Solids, Mirrors, Light sources and illumination, Target detection
J. Electron. Imag. 29(4), 043013 (27 July 2020)
TOPICS: Detection and tracking algorithms, Target detection, Submerged target detection, Feature extraction, Submerged target modeling, Image enhancement, Robots, Oceanography, Environmental sensing
J. Electron. Imag. 29(4), 043014 (28 July 2020)
TOPICS: Feature extraction, Lithium, Cameras, Data modeling, Image processing, Performance modeling, Convolution, Mining, Machine vision
J. Electron. Imag. 29(4), 043015 (30 July 2020)
TOPICS: Matrices, Chromium, Image classification, Optimization (mathematics), Distance measurement, Detection and tracking algorithms, Machine vision, Pattern recognition, Data modeling
J. Electron. Imag. 29(4), 043016 (3 August 2020)
TOPICS: Image enhancement, Image filtering, Medical imaging, Fractal analysis, Video, Filtering (signal processing), Digital filtering, Image processing, Surface plasmons
J. Electron. Imag. 29(4), 043017 (4 August 2020)
TOPICS: Long wavelength infrared, Image registration, Infrared radiation, Infrared imaging, Visible radiation, Sensors, Image filtering, Feature extraction, Gaussian filters
J. Electron. Imag. 29(4), 043018 (4 August 2020)
TOPICS: Matrices, Image classification, Feature extraction, Lab on a chip, Light emitting diodes, Facial recognition systems, Vector spaces, Data modeling, Visualization
J. Electron. Imag. 29(4), 043019 (8 August 2020)
TOPICS: Fiber optic gyroscopes, Air contamination, Scattering, Image processing, Light scattering, Signal attenuation, Water, RGB color model, Detection and tracking algorithms
J. Electron. Imag. 29(4), 043020 (10 August 2020)
TOPICS: Denoising, Convolutional neural networks, Performance modeling, Network architectures, Interference (communication), Data modeling, Visualization, Image denoising, Signal to noise ratio
J. Electron. Imag. 29(4), 043021 (12 August 2020)
TOPICS: Binary data, Fuzzy logic, Image classification, Quantization, Computer programming, Principal component analysis, Image quality, Viruses, Feature extraction
J. Electron. Imag. 29(4), 043022 (12 August 2020)
TOPICS: Roads, LIDAR, 3D modeling, Cameras, Unmanned vehicles, Image fusion, 3D image processing, Sensors, Image segmentation
J. Electron. Imag. 29(4), 043023 (17 August 2020)
TOPICS: Iris recognition, Sensors, Image processing, Safety, Eye models, Detection and tracking algorithms, Image filtering, Data modeling, Image fusion
J. Electron. Imag. 29(4), 043024 (25 August 2020)
J. Electron. Imag. 29(4), 043027 (28 August 2020)
J. Electron. Imag. 29(4), 043030 (28 August 2020)
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