Journal of Electronic Imaging
VOL. 29 · NO. 4 | July 2020
CONTENTS
Special Section on Quality Control by Artificial Vision VI
J. Electron. Imag. 29(4), 041002 (28 December 2019)https://doi.org/10.1117/1.JEI.29.4.041002
TOPICS: Skin, Image classification, Neural networks, Injuries, Feature extraction, Data modeling, Ultraviolet radiation, Diagnostics, Algorithm development, Surgery
J. Electron. Imag. 29(4), 041003 (31 December 2019)https://doi.org/10.1117/1.JEI.29.4.041003
TOPICS: Skin, Computing systems, Image segmentation, Light sources and illumination, Picosecond phenomena, Image processing, Image acquisition, RGB color model, Calibration, Mouse models
J. Electron. Imag. 29(4), 041004 (11 January 2020)https://doi.org/10.1117/1.JEI.29.4.041004
TOPICS: Light sources, Reflectivity, Digital micromirror devices, Calibration, Spherical lenses, Visualization, Solids, Statistical analysis, Data modeling, Error analysis
J. Electron. Imag. 29(4), 041005 (20 January 2020)https://doi.org/10.1117/1.JEI.29.4.041005
TOPICS: Model-based design, Data modeling, Computer programming, Molybdenum, 3D modeling, Inspection, Lawrencium, Video, Performance modeling, Binary data
J. Electron. Imag. 29(4), 041006 (17 January 2020)https://doi.org/10.1117/1.JEI.29.4.041006
TOPICS: Polarization, Cameras, Reflection, Imaging systems, 3D acquisition, 3D modeling, Sensors, Visualization, Error analysis, Polarization analysis
J. Electron. Imag. 29(4), 041007 (4 February 2020)https://doi.org/10.1117/1.JEI.29.4.041007
TOPICS: Image segmentation, Inspection, Cameras, Modulation, Data modeling, Computer programming, LCDs, Image processing, Convolutional neural networks, Defect detection
J. Electron. Imag. 29(4), 041008 (17 February 2020)https://doi.org/10.1117/1.JEI.29.4.041008
TOPICS: Clouds, Sensors, 3D modeling, Inspection, Environmental sensing, Solid modeling, Data modeling, Computer aided design, RGB color model, Chemical elements
J. Electron. Imag. 29(4), 041009 (21 February 2020)https://doi.org/10.1117/1.JEI.29.4.041009
TOPICS: Sensors, Video, Glasses, X-rays, RGB color model, Cameras, Inspection, Optical filters, X-ray technology, Algorithm development
J. Electron. Imag. 29(4), 041010 (3 March 2020)https://doi.org/10.1117/1.JEI.29.4.041010
TOPICS: Data modeling, Neural networks, Prototyping, Image classification, Unmanned aerial vehicles, Machine learning, Defect detection, Inspection, 3D modeling, Optical inspection
J. Electron. Imag. 29(4), 041011 (5 March 2020)https://doi.org/10.1117/1.JEI.29.4.041011
TOPICS: Calibration, Polarization, Cameras, Optical filters, Polarimetry, Sensors, Image filtering, Error analysis, Imaging arrays, Radio optics
J. Electron. Imag. 29(4), 041012 (25 April 2020)https://doi.org/10.1117/1.JEI.29.4.041012
TOPICS: Clouds, 3D modeling, Inspection, Solid modeling, Computer aided design, Data modeling, 3D scanning, RGB color model, Image segmentation, Scanners
J. Electron. Imag. 29(4), 041013 (28 April 2020)https://doi.org/10.1117/1.JEI.29.4.041013
TOPICS: Inspection, X-rays, X-ray imaging, X-ray computed tomography, Feature extraction, Statistical modeling, Binary data, Neural networks, Error analysis, Defect detection
J. Electron. Imag. 29(4), 041014 (8 August 2020)https://doi.org/10.1117/1.JEI.29.4.041014
TOPICS: Polarimetry, Polarization, Sensors, Reflection, Cameras, Manufacturing, Feature extraction, Imaging systems, Image quality
Regular Articles
J. Electron. Imag. 29(4), 043001 (6 July 2020)https://doi.org/10.1117/1.JEI.29.4.043001
TOPICS: RGB color model, Gallium nitride, Data modeling, Feature extraction, Image fusion, Computer programming, Convolution, Visualization, Image processing
J. Electron. Imag. 29(4), 043002 (7 July 2020)https://doi.org/10.1117/1.JEI.29.4.043002
TOPICS: Data modeling, Chromium, Video, Statistical modeling, Error analysis, Expectation maximization algorithms, Head, Feature extraction, Databases
J. Electron. Imag. 29(4), 043003 (9 July 2020)https://doi.org/10.1117/1.JEI.29.4.043003
TOPICS: Calibration, Cameras, Microlens, Image sensors, Sensors, Microlens array, Vignetting, Signal to noise ratio, RGB color model
J. Electron. Imag. 29(4), 043004 (10 July 2020)https://doi.org/10.1117/1.JEI.29.4.043004
TOPICS: Defect detection, Magnetism, Convolution, Image processing, Convolutional neural networks, Inspection, Image enhancement, Data modeling, Performance modeling
J. Electron. Imag. 29(4), 043005 (10 July 2020)https://doi.org/10.1117/1.JEI.29.4.043005
TOPICS: Denoising, Convolution, Feature extraction, Image denoising, Performance modeling, Image filtering, Signal to noise ratio, Visualization, Image segmentation
J. Electron. Imag. 29(4), 043006 (15 July 2020)https://doi.org/10.1117/1.JEI.29.4.043006
TOPICS: Image restoration, Image fusion, Image transmission, Signal attenuation, Image enhancement, Light scattering, Scattering, Light sources, Absorption
J. Electron. Imag. 29(4), 043007 (16 July 2020)https://doi.org/10.1117/1.JEI.29.4.043007
TOPICS: Video, Digital watermarking, Cameras, Binary data, Detection and tracking algorithms, Steganography, Signal processing, Speckle, Video compression
J. Electron. Imag. 29(4), 043008 (17 July 2020)https://doi.org/10.1117/1.JEI.29.4.043008
TOPICS: Light emitting diodes, Cameras, Reflectivity, Sensors, Seaborgium, Optical filters, Error analysis, Calibration, LED lighting
J. Electron. Imag. 29(4), 043009 (20 July 2020)https://doi.org/10.1117/1.JEI.29.4.043009
TOPICS: Visualization, Image segmentation, Convolutional neural networks, Neural networks, Detection and tracking algorithms, Optical character recognition, Feature extraction, Surveillance, Image classification
J. Electron. Imag. 29(4), 043010 (20 July 2020)https://doi.org/10.1117/1.JEI.29.4.043010
TOPICS: Image restoration, Air contamination, Image fusion, Atmospheric modeling, Denoising, Image processing, Light sources, Lithium, Scattering
J. Electron. Imag. 29(4), 043011 (21 July 2020)https://doi.org/10.1117/1.JEI.29.4.043011
TOPICS: Image quality, Databases, Visualization, Feature extraction, Distortion, Image processing, Image fusion, Image visualization, Remote sensing
J. Electron. Imag. 29(4), 043012 (24 July 2020)https://doi.org/10.1117/1.JEI.29.4.043012
TOPICS: Sensors, Feature extraction, Testing and analysis, Stars, Statistical modeling, Solids, Mirrors, Light sources and illumination, Target detection
J. Electron. Imag. 29(4), 043013 (27 July 2020)https://doi.org/10.1117/1.JEI.29.4.043013
TOPICS: Detection and tracking algorithms, Target detection, Submerged target detection, Feature extraction, Submerged target modeling, Image enhancement, Robots, Oceanography, Environmental sensing
J. Electron. Imag. 29(4), 043014 (28 July 2020)https://doi.org/10.1117/1.JEI.29.4.043014
TOPICS: Feature extraction, Lithium, Cameras, Data modeling, Image processing, Performance modeling, Convolution, Mining, Machine vision
J. Electron. Imag. 29(4), 043015 (30 July 2020)https://doi.org/10.1117/1.JEI.29.4.043015
TOPICS: Matrices, Chromium, Image classification, Optimization (mathematics), Distance measurement, Detection and tracking algorithms, Machine vision, Pattern recognition, Data modeling
J. Electron. Imag. 29(4), 043016 (3 August 2020)https://doi.org/10.1117/1.JEI.29.4.043016
TOPICS: Image enhancement, Image filtering, Medical imaging, Fractal analysis, Video, Filtering (signal processing), Digital filtering, Image processing, Surface plasmons
J. Electron. Imag. 29(4), 043017 (4 August 2020)https://doi.org/10.1117/1.JEI.29.4.043017
TOPICS: Long wavelength infrared, Image registration, Infrared radiation, Infrared imaging, Visible radiation, Sensors, Image filtering, Feature extraction, Gaussian filters
J. Electron. Imag. 29(4), 043018 (4 August 2020)https://doi.org/10.1117/1.JEI.29.4.043018
TOPICS: Matrices, Image classification, Feature extraction, Lab on a chip, Light emitting diodes, Facial recognition systems, Vector spaces, Data modeling, Visualization
J. Electron. Imag. 29(4), 043019 (8 August 2020)https://doi.org/10.1117/1.JEI.29.4.043019
TOPICS: Fiber optic gyroscopes, Air contamination, Scattering, Image processing, Light scattering, Signal attenuation, Water, RGB color model, Detection and tracking algorithms
J. Electron. Imag. 29(4), 043020 (10 August 2020)https://doi.org/10.1117/1.JEI.29.4.043020
TOPICS: Denoising, Convolutional neural networks, Performance modeling, Network architectures, Interference (communication), Data modeling, Visualization, Image denoising, Signal to noise ratio
J. Electron. Imag. 29(4), 043021 (12 August 2020)https://doi.org/10.1117/1.JEI.29.4.043021
TOPICS: Binary data, Fuzzy logic, Image classification, Quantization, Computer programming, Principal component analysis, Image quality, Viruses, Feature extraction
J. Electron. Imag. 29(4), 043022 (12 August 2020)https://doi.org/10.1117/1.JEI.29.4.043022
TOPICS: Roads, LIDAR, 3D modeling, Cameras, Unmanned vehicles, Image fusion, 3D image processing, Sensors, Image segmentation
J. Electron. Imag. 29(4), 043023 (17 August 2020)https://doi.org/10.1117/1.JEI.29.4.043023
TOPICS: Iris recognition, Sensors, Image processing, Safety, Eye models, Detection and tracking algorithms, Image filtering, Data modeling, Image fusion
J. Electron. Imag. 29(4), 043024 (25 August 2020)https://doi.org/10.1117/1.JEI.29.4.043024
J. Electron. Imag. 29(4), 043027 (28 August 2020)https://doi.org/10.1117/1.JEI.29.4.043027
J. Electron. Imag. 29(4), 043030 (28 August 2020)https://doi.org/10.1117/1.JEI.29.4.043030
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